參數(shù)資料
型號: ST7LNB0V2Y0M6
廠商: STMICROELECTRONICS
元件分類: 微控制器/微處理器
英文描述: 8-BIT, 8 MHz, MICROCONTROLLER, PDSO16
封裝: 0.150 INCH, PLASTIC, SOP-16
文件頁數(shù): 11/30頁
文件大小: 451K
代理商: ST7LNB0V2Y0M6
ST7LNB0V2Y0
Electrical characteristics
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations:
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Prequalification trials:
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
6.5.2
Electromagnetic Interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 17.
EMS characteristics
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD=5V, TA=+25 °C, fOSC=8MHz
conforms to IEC 1000-4-2
2B
VFFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VDD pins
to induce a functional disturbance
VDD=5V, TA=+25 °C, fOSC=8MHz
conforms to IEC 1000-4-4
3B
Table 18.
EMI characteristics(1)
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fOSC/fCPU]
Unit
1/4MHz
1/8MHz
SEMI
Peak level
VDD=5V, TA=+25 °C,
SO16 package,
conforming to SAE J 1752/3
0.1 MHz to 30 MHz
8
14
dB
V
30 MHz to 130 MHz
27
32
130 MHz to 1 GHz
26
28
SAE EMI Level
3.5
4
-
1.
Data based on characterization results, not tested in production.
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