參數(shù)資料
型號(hào): SDA9400
廠商: MICRONAS SEMICONDUCTOR HOLDING AG
英文描述: Scan Rate Converter using Embedded DRAM Technology Units
中文描述: 掃描頻率轉(zhuǎn)換器采用嵌入式DRAM技術(shù)股
文件頁(yè)數(shù): 28/94頁(yè)
文件大?。?/td> 1180K
代理商: SDA9400
SDA 9400
Micronas
28
Preliminary Data Sheet
Example of noise measurement
Input write parameter
Input read parameter
Parameter
Subaddress
Description
NMALG
1Dh
Noise measurement algorithm
1: measurement during vertical blanking period (measure
line can be defined by NMLINE)
0: measurement in the first active line
Line for noise measurement (only valid for NMALG=1)
NMLINE
28h
Parameter
Subaddress
Description
NOISEME
32h
Noise level of the input signal: 0 (no noise), ... , 30
(strong noise) [31 (strong noise or measurement failed)]
Signals a new value for NOISEME
1: a new value can be read
0: current noise measurement not finalized
(see also
I2C bus format
on page 64)
NMSTATUS
33h
1
2
3
4
5
6
7
625
624
623
Field1 (A)
313-1
314-2
315-3
316-4
317-5
318-6
319-7
312
311
310
Field2 (B)
PAL
H-sync
V-sync
H-sync
V-sync
VINDEL=0
NMLINE=0
:
:
Measure
NMLINE=3
VINDEL=0
NMLINE=0
:
:
Measure
NMLINE=3
Measure
Measure
N
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