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參數(shù)資料
| 型號： | MCRF360 |
| 廠商： | Microchip Technology Inc. |
| 英文描述： | CONNECTOR |
| 中文描述： | 連接器 |
| 文件頁數(shù)： | 4/23頁 |
| 文件大?。?/td> | 568K |
| 代理商： | MCRF360 |
MCRF355/360
DS21287F-page 4
2002 Microchip Technology Inc.
TABLE 1-3:
AC CHARACTERISTICS
All parameters apply across
the specified operating
ranges, unless otherwise
noted.
Commercial (C):
T
AMB
= -20
o
C to 70
o
C
Parameters
Symbol
Min
Typ
Max
Units
Conditions
Carrier frequency
F
C
13.56
MHz
Reader’s transmitting frequency
Modulation frequency
F
M
58
70
82
kHz
Manchester coding, at V
DD
= 2.6 V
DC
- 5 V
DC
Coil voltage during reading
V
PP
_
AC
4
—
—
V
PP
Peak-to-Peak AC voltage across the
coil during reading
Coil clamp voltage
V
CLMP
_
AC
—
32
—
V
PP
Peak-to-Peak coil clamp voltage
Test mode clock frequency
F
CLK
115
500
kHz
25°C
SLEEP time
T
OFF
50
100
200
ms
Off time for anti-collision feature, at
25°C and V
DD
= 2.5 V
DC
Internal resonant capacitor
(MCRF360)
C
RES
85
100
115
pF
Internal resonant capacitor between
Antenna A and V
SS
, at 13.56 MHz
Write/Erase pulse width
T
WC
—
2
10
ms
Time to program bit, at 25°C
Clock high time
T
HIGH
—
4.4
—
μ
s
25°C for testing and programming
Clock low time
T
LOW
—
4.4
—
μ
s
25°C for testing and programming
STOP condition pulse width
T
PW
:
STO
—
1000
—
ns
25°C for testing and programming
STOP condition setup time
T
SU
:
STO
—
200
—
ns
25°C for testing and programming
Setup time for high voltage
T
SU
:
HH
—
800
—
ns
25°C for testing and programming
High voltage delay time
T
DL
:
HH
—
800
—
ns
Delay time before the next clock, at
25°C for testing and programming
Data input setup time
T
SU
:
DAT
—
450
—
ns
25°C for testing and programming
Data input hold time
T
HD
:
DAT
—
1.2
—
μ
s
25°C for testing and programming
Output valid from clock
T
AA
—
200
—
ns
25°C for testing and programming
Data retention
—
200
—
Years For T < 120°C
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