參數(shù)資料
型號: MC74AC00M
廠商: ON SEMICONDUCTOR
元件分類: 門電路
英文描述: AC SERIES, QUAD 2-INPUT NAND GATE, PDSO14
封裝: EIAJ, PLASTIC, 14 PIN
文件頁數(shù): 29/45頁
文件大小: 434K
代理商: MC74AC00M
http://onsemi.com
39
Figure 1–52. I/O Pin Internal Structure
VCC
IIN
IOZ
CLAMP DIODES
INPUT
OUTPUT
The pin is either an input or an output. When testing the
ICC of the device, the pins selected as outputs by the T/R
signal must either be enabled and left open or be disabled
and tied to either rail. If the output device is disabled and
allowed to float, the input device will also float, and an
excessive amount of current will flow from VCC to ground.
A simple rule to follow is to treat any output which is
disabled as an input. This will help insure the integrity of an
ICC test.
Another area which might precipitate problems is the
measurement of the leakages on I/O pins. The I/O pin
internal structure is depicted below.
The pin is internally connected to both an input device and
an output device; the limit for a leakage test must be the
combined IIN specification of the input and the IOZ
specification of the output. For FACT devices, IIN is
specified at
±1 A while IOZ is specified at ±5 A.
Combining these gives a limit of
±6 A for I/O pins. Usually,
I/O pins will show leakages that are less than the IOZ
specification of the output alone.
Testing CMOS circuits is no more difficult than testing
their bipolar counterparts. However, there are some areas of
concern that will be new to many test engineers beginning
to work with CMOS. Becoming familiar with and
understanding these areas of concern prior to creating a test
philosophy will avert many problems that might otherwise
arise later.
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