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參數(shù)資料
| 型號： | MC74AC00M |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 門電路 |
| 英文描述： | AC SERIES, QUAD 2-INPUT NAND GATE, PDSO14 |
| 封裝： | EIAJ, PLASTIC, 14 PIN |
| 文件頁數(shù)： | 13/45頁 |
| 文件大?。?/td> | 434K |
| 代理商： | MC74AC00M |
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‘ACxx Devices
‘ACTxx Devices
VCC
VCC - 0.1 V
70% VCC
30% VCC
0.1 V
0 V
AC TEST
INPUT LEVELS
DC LOW
INPUT RANGE
LOW LEVEL
NOISE
IMMUNITY
DC HIGH
INPUT RANGE
HIGH LEVEL
NOISE
IMMUNITY
TRANSITION
REGION
AC TEST
INPUT LEVELS
DC LOW
INPUT RANGE
LOW LEVEL
NOISE
IMMUNITY
DC HIGH
INPUT RANGE
HIGH LEVEL
NOISE
IMMUNITY
TRANSITION
REGION
VCC
VCC - 0.1 V
0.1 V
0 V
0.8 V
2 V
3 V
Figure 1–22a. Test Input Signal Levels
Figure 1–22b. Test Input Signal Levels
Test Conditions
Figure 1–22a and 1–22b describe the input signal voltage
levels to be used when testing FACT circuits. The AC test
conditions follow industry convention requiring VIN to
range from 0 V for a logic LOW to 3 V for a logic HIGH for
‘ACT devices and 0 V to VCC for ‘AC devices. The DC
parameters are normally tested with VIN at guaranteed input
levels, that is VIH to VIL (see data tables for details). Care
must be taken to adequately decouple these high
performance parts and to protect the test signals from
electrical noise. In an electrically noisy environment, (e.g.,
a tester and handler not specifically designed for high speed
work), DC input levels may need to be adjusted to increase
the noise margin to allow for the extra noise in the tester
which would not be seen in a system.
Noise immunity testing is performed by raising VIN to the
nominal supply voltage of 5 V then dropping to a level
corresponding to VIH characteristics, and then raising again
to the 5 V level. Noise tests can also be performed on the VIL
characteristics by raising VIN from 0 V to VIL, then
returning to 0 V. Both VIH and VIL noise immunity tests
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| MC74ACT05DT | ACT SERIES, HEX 1-INPUT INVERT GATE, PDSO14 |
| MC74AC109N | AC SERIES, DUAL POSITIVE EDGE TRIGGERED J-KBAR FLIP-FLOP, COMPLEMENTARY OUTPUT, PDIP16 |
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MC74AC00MEL | 功能描述:邏輯門 2-6V Quad 2-Input RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| MC74AC00MELG | 功能描述:邏輯門 2-6V Quad 2-Input NAND RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
| MC74AC00ML1 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| MC74AC00MR1 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| MC74AC00N | 功能描述:邏輯門 2-6V Quad 2-Input RoHS:否 制造商:Texas Instruments 產(chǎn)品:OR 邏輯系列:LVC 柵極數(shù)量:2 線路數(shù)量（輸入/輸出）:2 / 1 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 傳播延遲時間:3.8 ns 電源電壓-最大:5.5 V 電源電壓-最小:1.65 V 最大工作溫度:+ 125 C 安裝風格:SMD/SMT 封裝 / 箱體:DCU-8 封裝:Reel |
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