參數(shù)資料
型號(hào): MAS281
廠商: Dynex Semiconductor Ltd.
英文描述: MIL-STD-1750A Microprocessor
中文描述: 符合MIL - STD - 1750A微處理器
文件頁數(shù): 54/55頁
文件大小: 551K
代理商: MAS281
MAS281
54/55
11.0 RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL-STD-883 test method 1019 Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x10
5
Rad(Si)
Transient Upset (Stored data loss)
1x10
11
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
<1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 32: Radiation Hardness Parameters
12.0 ORDERING INFORMATION
The processor can be ordered in the form of a module,
consisting of three chips in leadless chip carriers, mounted on
a ceramic tile. The module can be supplied with dual-in-line (C)
or flatpack (F) lead configurations.
The three chips which form the processor can be packaged
as separate devices. They are available in leadless chip carrier
(L), flatpack (F), or ceramic dual-in-line packages (C).
Module -
MAx281xxx
Chip Set -
MAx17501xxx
MAx17502xxx
MAx17503xxx
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