參數(shù)資料
型號: MAS281
廠商: Dynex Semiconductor Ltd.
英文描述: MIL-STD-1750A Microprocessor
中文描述: 符合MIL - STD - 1750A微處理器
文件頁數(shù): 42/55頁
文件大?。?/td> 551K
代理商: MAS281
MAS281
42/55
NO.
Parameter
Test Condition
(notes 1 & 9)
Min.
(note 2)
Max.
(note 2)
Units
31
32
33
34
35
36
37
38
39
SYNC lo to DMAK valid
DMAK valid after SYNC lo
DMAK lo to DD lo
DMAK hi to DD hi
DMAK lo to CD lo
DMAK hi to CD hi
DMAK lo to AD Bus Hi-Z (note 7)
DMAK hi to AD Bus valid (note 10) Load 2
DMAK lo to AS, DS, M/IO, RD/W,
IN/OP Hi-Z (note 7)
DMAK hi to AS, DS, M/IO,
RD/W, IN/OP valid (note 10)
HOLD set up to SYNC lo
HOLD hold after SYNC lo
SYNC lo to HLDAK valid
HLDAK valid after SYNC lo
HLDAK lo to DD lo
HLDAK hi to DD hi
HLDAK lo to CD lo
HLDAK hi to CD hi
HLDAK lo to AD Bus Hi-Z
(Hold) (notes 7 & 10))
HLDAK hi to AD bus
valid (note 10)
HLDAK to AS, DS, M/IO,
RD/W, IN/OP Hi-Z (notes 7 & 10)
HLDAK to AS, DS, M/IO,
RD/W, IN/OP valid (note 10)
Interrupts set up to SYNC lo
Interrupts hold after SYNC lo
Faults setup to SYNC lo
Faults hold after SYNC lo
SYNC lo to SURE, NPU valid
SYNC hi to CONFW valid
TCLK lo to ILLAD lo (Bus timeout)
(note 10)
SYNC lo to ILLAD hi (Bus timeout)
(note 10)
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
Load 2
-
5
-
-
-
-
-
-
50
-
30
30
30
30
70
60
ns
ns
ns
ns
ns
ns
ns
ns
Load 2
-
50
ns
40
Load 2
-
40
15
-
-7
-
-
-
-
59
-
-
20
-
50
50
50
50
ns
ns
41
42
43
44
45
46
47
48
49
SYNC
Load 1
Load 1
Load 1
Load 1
Load 1
Load 1
ns
ns
ns
ns
ns
ns
Load 2
-
60
ns
50
Load 2
-
50
ns
51
Load 2
-
30
ns
52
Load 1
-
20
10
20
15
-
-
30
-
-
-
-
50
75
ns
ns
ns
ns
ns
ns
ns
53
54
55
56
57
58
59
Load 1
Load 1
Load 1
-
75
ns
60
Load 1
-
75
ns
Notes:
1. Unless otherwise noted, test conditions are as follows: OSC duty cycle = 50%, input rise and fall tlme < 5ns, timing
measured from 50% of VDD points.
2. t = 1 OSC period. O 5t implies a 50% OSC duty cycle; fractional t's may be adjusted to reflect actual OSC duty cycle.
7. Measured to pre-Hi-Z steady state
±
10% of VDD.
9. Output references SYNC, DMAK, and HLDAK drive into load 1.
10. Guaranteed by component LSI testing: not measured on microprocessor module.
Table 10: Timing Parameters (continued)
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