參數(shù)資料
型號(hào)： HS-6664RH
廠商： Intersil Corporation
英文描述： Radiation Hardened 8K x 8 CMOS PROM
中文描述： 輻射加固8K的× 8的CMOS胎膜早破
文件頁數(shù)： 3/14頁
文件大小： 222K
代理商： HS-6664RH
842
Specifications HS-6664RH
Absolute Maximum Ratings
Reliability Information
Supply Voltage (All Voltages Reference to Device GND). . . . .+7.0V
Input or Output Voltage
Applied for All Grades. . . . . . . . . . . . . . . . . GND-0.3V to VDD+0.3V
Storage Temperature Range . . . . . . . . . . . . . . . . . -65
o
C to +150
o
C
Junction Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
Lead Temperature (Soldering 10s). . . . . . . . . . . . . . . . . . . . +300
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
Braze Seal DIP Package. . . . . . . . . . . . .
Braze Seal Flatpack Package . . . . . . . . .
Maximum Package Power Dissipation at +125
o
C
Braze Seal DIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . 1.75W
Braze Seal Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 936mW
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26,817 Gates
θ
JA
θ
JC
40.0
o
C/W
53.4
o
C/W
4.0
o
C/W
6.0
o
C/W
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
Operating Conditions
Operating Supply Voltage Range (VDD) . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . .0V to +0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . . . +2.4V to VDD
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Guaranteed and 100% Tested.
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
GROUP A
SUBGROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
High Level Output
Voltage
VOH1
VDD = 4.5V, IO = -2.0mA
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
3.5
-
V
Output High Voltage
VOH2
VDD = 4.5V, IO = 100
μ
A
3
-55
o
C
≤
T
A
≤
+125
o
C
VDD
-0.3V
-
V
Low Level Output
Voltage
VOL
VDD = 4.5V, IO = 4.8mA
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
-
0.4
V
High Impedance Output
Leakage Current
IOZ
VDD = 5.5V, G = 5.5V,
VI/O = GND or VDD
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
-10.0
10.0
μ
A
Input Leakage Current
II
VDD = 5.5V, VI = GND or
VDD, P Not Tested
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
-1.0
1.0
μ
A
Standby Supply Current
IDDSB
VDD = 5.5V, IO = 0mA,
VI = VDD or GND
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
-
500
μ
A
Operating Supply
Current
IDDOP
VDD = 5.5V, G = VDD,
(Note 3), f = 1MHz,
IO = 0mA, VI = VDD or GND
1, 2, 3
-55
o
C
≤
T
A
≤
+125
o
C
-
15
mA
Functional Test
FT
VDD = 4.5V (Note 4)
7, 8A, 8B
-55
o
C
≤
T
A
≤
+125
o
C
-
-
-
NOTES:
1. All voltages referenced to device GND.
2. All tests performed with P hardwired to VDD.
3. Typical derating = 15mA/MHz increase in IDDOP.
4. Tested as follows: f = 1MHz, VIH = 2.4V, VIL = 0.45V, IOH = -1mA, IOL = +1mA, VOH
≥
1.5V, VOL
≤
1.5V.
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Guaranteed and 100% Tested.
PARAMETER
SYMBOL
(NOTES 1, 2, 3)
CONDITIONS
GROUP A
SUBGROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Output Enable Access Time
TGLQV
VDD = 4.5V and 5.5V
9, 10, 11
-55
o
C
≤
T
A
≤
+125
o
C
-
20
ns
Chip Enable Access Time
TELQV
VDD = 4.5V and 5.5V
9, 10, 11
-55
o
C
≤
T
A
≤
+125
o
C
-
60
ns
Address Setup Time
TAVEL
VDD = 4.5V and 5.5V
9, 10, 11
-55
o
C
≤
T
A
≤
+125
o
C
5
-
ns
Address Hold Time
TELAX
VDD = 4.5V and 5.5V
9, 10, 11
-55
o
C
≤
T
A
≤
+125
o
C
12
-
ns
Spec Number
518741
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