參數(shù)資料
型號: BU-64743G8-200
廠商: DATA DEVICE CORP
元件分類: 微控制器/微處理器
英文描述: 2 CHANNEL(S), 1M bps, MIL-STD-1553 CONTROLLER, CQFP80
封裝: 22.35 X 22.35 MM, 3.30 MM HEIGHT, CERAMIC, QFP-80
文件頁數(shù): 65/93頁
文件大小: 585K
代理商: BU-64743G8-200
68
Data Device Corporation
www.ddc-web.com
BU-6474X/6484X/6486X
J-07/05-0
41
PIN
DB06
42
DB08
43
+3.3V_LOGIC for BU-64XX3 or +5.0V_LOGIC for BU-64XX5
GND_LOGIC
44
DB05
45
DB03
46
47
DB02
48
DB00
49
RTAD1
50
RTADP
51
FUNCTION
DB04
52
DB01
DB09
53
DB14
54
55
DB12
56
DB13
57
DB07
TX_INH_A
IOEN
INT
61
TRANS/BUFF
63
64
65
GND_LOGIC
+3.3V_LOGIC for BU-64XX3 or +5.0V_LOGIC for BU-64XX5
69
70
RD/WR
71
A09
75
A12* or A12/RTBOOT**
76
A05
DB10
DB15
DB11
58
59
60
SELECT
READYD
62
66
STRBD
TX_INH_B
67
68
A15* or A15/CLK_SEL_1**
MSB/LSB/DTGRT
72
73
74
A11
1
A10
TX/RX_A
PIN
DO NOT CONNECT - FACTORY TEST POINT
2
FUNCTION
3
4
TX/RX_A
5
MEM/REG
6
A08
7
DO NOT CONNECT - FACTORY TEST POINT
+3.3V_XCVR for BU-64XXXF/G8/9 or
+5.0_XCVR for BU-64XXXF/G3/4
8
9
10
DO NOT CONNECT - FACTORY TEST POINT
11
TABLE 66. MINI-ACE MARK3 BU-64XXXF/G3/4/8/9 VERSIONS PINOUTS
A07
12
A03
13
SLEEPIN* or UPADDREN**
14
TX/RX_B
15
DO NOT CONNECT - FACTORY TEST POINT
TX/RX_B
A00
16
17
18
A02
19
ADDR_LAT/MEMOE
20
DO NOT CONNECT - FACTORY TEST POINT
21
GND_XCVR
TAG_CLK
RTAD2
22
23
24
MSTCLR
25
CLOCK_IN
26
A06
ZEROWAIT/MEMWR
27
28
16/8/DTREQ
29
+3.3V_LOGIC for BU-64XX3 or +5.0V_LOGIC for BU-64XX5
30
GND_LOGIC
INCMD/MCRST
31
32
A01
33
TRIG_SEL/MEMENA_IN
34
POL_SEL/DTACK
RT_AD_LAT
35
36
SSFLAG/EXT_TRIG
37
A13* or A13/+3.3V_LOGIC** for BU-64XX3
or +5.0V_LOGIC** for BU-64XX5
77
A04
78
RTAD0
38
RTAD3
39
GND_XCVR
79
A14* or A14/CLK_SEL_0**
80
RTAD4
40
* Applicable for 64K RAM option.
** Applicable for 4K RAM option.
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