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參數(shù)資料
| 型號： | AK2572 |
| 廠商： | Asahi Kasei Microsystems Co.,Ltd |
| 英文描述： | APC for Burst Mode Applicable Direct Modulation Laser Diode |
| 中文描述： | apc的突發(fā)模式適用的直接調(diào)制激光器 |
| 文件頁數(shù)： | 14/50頁 |
| 文件大小： | 463K |
| 代理商： | AK2572 |
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ASAHI KASEI
[AK2572]
-14-
<MS0290-E-01>
2004/8
4.
APC Functional Part
Circuit configuration of the APC part is shown in Figure 4-1. The AK2572 is formed with APC_FF function
which sets the programmed current with corresponding to the detected temperature by On-chip temperature
sensor and APC_FB function which controls with feedback function to keep the monitoring photo diode current
constant. By properly combining APC_FF and APC_FB functions together by EEPROM / Register setting, a
proper LD Bias current / Modulation current can be generated.
Figure 4-1 APC Circuit Block Diagram
Temp. sensor
(TEMPSENS)
ADC
(Time sharing)
EEPROM
CURRALM
Over current threshold
(RE_CURRALM_MOD)
(RE_CURRALM_BIAS)
R_DAC1/R_DAC3
APC_FB value
(R_APC_FB)
PDGAIN
Monitor
PD
APC target
(RE_APC_TRGT)
OPTALM
_COMP
optalm_ref
PDIN
IBIAS
I-DAC2
PDMON
Rpd
Cpd
DAC_APC
ATT
+
+
MOD: APC_FF value (R_MOD_FF)
BIAS: APC_FF value
(R_BIAS_FF)
TEMP
ALM
TEMPALMthreshold
(E_TEMPALM)
Tempalm
Temperature
equivalent value
(R_TEMP)
vpd
vapc_ref
APC_
COMP
MOD data
BIAS data
(R_DAC2)
TEMPMON
On-chip temperature sensor
offset adjusting
(RE_TEMP_OFFSET)
APC_FF setting
(RE_APC_FF_SET)
APC_FB initial value setting
(RE_APC_INIT_SET)
Power Leveling[1] setting
(RE_PWR_LVL1_SET)
(RE_SFP_SET)
Power Leveling[2] setting
(RE_PWR_LVL2_SET)
(RE_PWR_SEL)
I-DAC2 gain setting
(RE_DAC2_GAIN)
I-DAC1 gain setting
(RE_DAC1_GAIN)
OPALM threshold (RE_OPTALM)
PDGAIN setting
(RE_PDGAIN)
APC_FB setting
(RE_APC_FB_SET)
K_MOD
_FBRT
K_BIAS
_FBRT
IMOD
R_DAC2
Curralm
Optalm
x 0.012
BIASMON
1/N
1/s
Digital Filter
I-DAC1
V-DAC3
I-DAC2 operation setting
(RE_DAC_SET[1])
I-DAC1 operation setting
(RE_DAC_SET[0])
V-DAC3 operation setting (RE_DAC_SET[2])
V-DAC3 gain setting (RE_DAC3_GAIN)
I-DAC1,V-DAC3 data selection
(RE_MODV_SEL)
MOD: APC_FB dividing
(RE_MOD_FBRT)
BIAS: APC_FB dividing
(RE_BIAS_FBRT)
Mod_Ctrl
Burst mode setting (RE_BURST_SET)
EXTALMpolarity setting
(RE_EXTALM1_POL)
(RE_EXTALM2_POL)
EXTRA_DAC value (R_EXTRA)
EXTALM1
EXTALM2
/MOD_CTRL
BURST
BURST_
CONTROL
B
ｕｒｓｔ
_
ｃｔｒｌ
EXTALM
Pin setting
(RE_SFP_SET
）
(RE_PWR_LVL1_SET
）
Extalm1
Extalm2
IOUT1
VOUT3
IOUT2
R_DAC3
R_DAC1
4. 1
APC_FF Function
APC_FF functional block diagram is shown in Figure 4-2. Output voltage of On-chip temperature sensor, which
responds to the detected temperature, is A-to-D converted (8 bits) in every temperature detection cycle (64 msec
[Typ.]). The resulting data (R_TEMP) is used as an EEPROM address and the data (8 bits) retained in
EEPROM at that address location is read out. The read out data is set to DAC and by supplying a proper
current to LD in response to temperature characteristics of each LD, APC_FF function is realized as in the
procedure above. Namely, the EEPROM address corresponds to temperature and the data corresponds to the
bias current and the modulation current at that temperature.
Although allocated EEPROM space for APC_FF is 7 bits (128 address locations), it is extended to 8 bits
equivalent data (256 address locations) by utilizing a linear interpolation of the current programming data as
shown in the following equation.
< Linear interpolation of E_BIAS_TC and E_MOD_TC >
Given that the detected temperature data are R_TEMP
［
7:0
］＝
z
＝
2x, 2x+1, R_TEMP
［
7:1
］＝
x, and the
temperature compensated data retained in EEPROM are E_BIAS_TC(x), E_MOD_TC(x), and the data
derived from linear interpolation are R_BIAS_FF(z), R_MOD_FF(z) respectively,
R_BIAS_FF(z)
＝
E_BIAS_TC(x
－
1)
＋｛
E_BIAS_TC(x)
－
E_BIAS_TC(x
－
1)
｝×
R_TEMP
［
0
］
/ 2
R_MOD_FF(z)
＝
E_MOD_TC(x
－
1)
＋｛
E_MOD_TC(x)
－
E_ MOD _TC(x
－
1)
｝×
R_TEMP
［
0
］
/ 2
But at x
＝
0 (R_TEMP
［
7:0
］＝
z
＝
0, 1), E_BIAS_TC(x)
＝
E_BIAS_TC(x
－
1)
＝
E_BIAS_TC(0)
E_MOD_TC(x)
＝
E_MOD_TC(x
－
1)
＝
E_MOD_TC(0)
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