參數(shù)資料
型號： 03H4969
元件分類： 通信及網(wǎng)絡(luò)
英文描述： SPECIALTY TELECOM CIRCUIT, PQFP100
封裝： 14 X 20 MM, 2.70 MM HEIGHT, 0.65 MM PITCH, PLASTIC, FP-100
文件頁數(shù)： 28/48頁
文件大小： 464K
代理商： 03H4969
Product Part Number: IBM22-ALDC1005S
ALDC1-5S
I B M Microelectronics
Document Number: DCALD5DSU-04
Data Compression
Figure
5-4 (Page 2 of 4). ALDC1-5S-P Pin Description. See Figure 5-3 on page 5-5 to identify pin
locations.
PIN
NAME
I/O
DESCRIPTION
N20
-OREQ
I
The original data interface direct memory access
request pin.
N21
-OWR
O
The original data interface direct memory access con-
troller write pin.
N22
-ORD
O
The original data interface direct memory access con-
troller read pin.
N23
-TEST
I
A manufacturing test input. Must be tied high.
N24
-TEST
I
A manufacturing test input. Must be tied high.
N25
-TEST
I
A manufacturing test input. Must be tied high.
N26
Unused. May be tied high, tied low, or not connected.
N27
GND
A ground pin.
N28
Vdd
A + 5 Volt power supply pin.
N29
Unused. May be tied high, tied low, or not connected.
N30
Unused. May be tied high, tied low, or not connected.
W01
-TEST
I
A manufacturing test input. Must be tied high.
W02
-TEST
I
A manufacturing test input. Must be tied high.
W03
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W04
Unused. May be tied high, tied low, or not connected.
W05
Unused. May be tied high, tied low, or not connected.
W06
Unused. May be tied high, tied low, or not connected.
W07
Unused. May be tied high, tied low, or not connected.
W08
GND
A ground pin.
W09
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W10
Vdd
A + 5 Volt power supply pin.
W11
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W12
Unused. May be tied high, tied low, or not connected.
W13
Unused. May be tied high, tied low, or not connected.
W14
Unused. May be tied high, tied low, or not connected.
W15
Unused. May be tied high, tied low, or not connected.
W16
Unused. May be tied high, tied low, or not connected.
W17
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W18
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W19
TESTINPUT
I
A manufacturing test input. May be tied high, tied low,
or not connected.
W20
Unused. May be tied high, tied low, or not connected.
(C) IBM CORP. 1993, 1994. ALL RIGHTS RESERVED. USE IS FURTHER SUBJECT TO THE PROVISIONS ON THE BACK OF THE TITLE PAGE.
5-6
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