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參數(shù)資料
| 型號： | SCANPSC110 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| 中文描述： | 掃描橋?qū)哟魏投帱c尋址JTAG端口（IEEE1149.1系統(tǒng)測試支援） |
| 文件頁數(shù)： | 9/29頁 |
| 文件大?。?/td> | 459K |
| 代理商： | SCANPSC110 |
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Hierarchical Test Support
Multiple SCANPSC110F Bridges can be used to assemble a
hierarchical boundary-scan tree. In such a configuration, the
system tester can configure the local ports of a set of
’PSC110Fs so as to connect a specific set of local
scan-chains to the active scan chain. Using this capability,
the tester can selectively communicate with specific portions
of a target system.
The tester’s scan port is connected to the backplane scan
port of a “root” layer of ’PSC110Fs, each of which can be se-
lected using multi-drop addressing. A second tier of
’PSC110Fs can be connected to this root layer, by connect-
ing a local port (LSP) of a root-layer ’PSC110F to the back-
plane port of a second-tier ’PSC110F. This process can be
continued to construct a multi-level scan hierarchy.
’PSC110F
local
ports
which
higher-level ’PSC110Fs can be thought of as the terminal
“l(fā)eaves” of a scan “tree”. The test master can select one or
more target leaves by selecting and configuring the local
ports of an appropriate set of ’PSC110Fs in the test tree.
are
not
cascaded
into
Level 1 Protocol
ADDRESSING MODES
The SCANPSC110F Bridge supports “single” and “multiple”
modes of addressing a ’PSC110F. The “single” mode will se-
lect one ’PSC110F and is called Direct Addressing. More
than one ’PSC110F device can be selected via the Broad-
cast and Multi-Cast Addressing modes.
S
www.national.com
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相關(guān)PDF資料 |
PDF描述 |
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| SCANPSC110FDMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FFMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANSTA101 | RES 30K OHM 1/16W 0.1% 0402 SMD |
| SCANSTA111SM | EMITTER IR 850NM 5MM RADIAL |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCANPSC110_ZFC3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| SCANPSC110F | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
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