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參數資料
| 型號： | SCANPSC110 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| 中文描述： | 掃描橋層次和多點尋址JTAG端口（IEEE1149.1系統(tǒng)測試支援） |
| 文件頁數： | 17/29頁 |
| 文件大小： | 459K |
| 代理商： | SCANPSC110 |
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Special Features
(Continued)
Update-IR were Select-DR TMS
would remain low and
synchronization would not occur until the ’PSC110F TAP
Controller entered the Run-Test/Idle state, as shown in Fig-
ure 11
Each local port has its own Local Scan Port Controller. This
is necessary because the LSPN can be configured in any
one of eight (8) possible combinations. Either one, some, or
all of the local ports can be accessed simultaneously. Con-
figuring the LSPN is accomplished with the mode register, in
conjunction with the UNPARK instruction.
The LSPN can be unparked in one of seven different con-
figurations, as specified by bits 0-2 of the mode register. Us-
ing multiple ports presents not only the task of synchronizing
the ’PSC110F TAP Controller with the TAP Controllers of an
individual local port, but also of synchronizing the individual
local ports to one another.
When multiple local ports are selected for access, it is pos-
sible that two ports are parked in different states. This could
occur when previous operations accessed the two ports
separately and parked them in the two different states. The
LSP Controllers handle this situation gracefully. Figure 12
shows the UNPARK instruction being used to access LSP
1
,
LSP
, and LSP
in series (mode register = “XXX0X111” bi-
nary). LSP
and LSP
become active as the ’PSC110F con-
troller is sequenced through the Run-Test/Idle state. LSP
3
remains parked in the Pause-DR state until the ’PSC110F
TAP Controller is sequenced through the Pause-DRstate. At
that point, all three local ports are synchronized for access
via the active scan chain.
DS100327-14
FIGURE 12. Synchronization of the Three Local Scan Ports (LSP
1
, LSP
2
, and LSP
3
)
S
www.national.com
17
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PDF描述 |
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| SCANPSC110FDMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FFMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANSTA101 | RES 30K OHM 1/16W 0.1% 0402 SMD |
| SCANSTA111SM | EMITTER IR 850NM 5MM RADIAL |
相關代理商/技術參數 |
參數描述 |
|---|---|
| SCANPSC110_ZFC3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| SCANPSC110F | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
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