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參數(shù)資料
| 型號： | SCANPSC110 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| 中文描述： | 掃描橋?qū)哟魏投帱c尋址JTAG端口（IEEE1149.1系統(tǒng)測試支援） |
| 文件頁數(shù)： | 24/29頁 |
| 文件大?。?/td> | 459K |
| 代理商： | SCANPSC110 |
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Appendix
Applications Example
The following sequence gives an example of how one might
use the SCANPSC110F Bridge to perform 1149.1 operations
via a multi-drop scan backplane. The system involved has
10 card slots, 8 of which are filled with modules, and 2 slots
are empty. (See Figure 18 ).
DS100327-17
Note:
The value of the TMS during the rising edge of TCK is located next to each transition.
FIGURE 17. IEEE 1149.1 TAP Controller State Diagram
DS100327-20
FIGURE 18. Boundary Scan Backplane with 10 Card Slots, 8 Slots Are Filled with Boards
S
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相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SCANPSC110FDMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FFMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANSTA101 | RES 30K OHM 1/16W 0.1% 0402 SMD |
| SCANSTA111SM | EMITTER IR 850NM 5MM RADIAL |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCANPSC110_ZFC3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
| SCANPSC110F | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
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