參數(shù)資料
型號: MC56F8147VVFE
廠商: Freescale Semiconductor
文件頁數(shù): 61/172頁
文件大?。?/td> 0K
描述: IC DGTL SIGNAL CTLR 160-MAPBGA
標(biāo)準(zhǔn)包裝: 126
系列: 56F8xxx
核心處理器: 56800E
芯體尺寸: 16-位
速度: 40MHz
連通性: EBI/EMI,SCI,SPI
外圍設(shè)備: POR,PWM,WDT
輸入/輸出數(shù): 76
程序存儲器容量: 128KB(64K x 16)
程序存儲器類型: 閃存
RAM 容量: 4K x 16
電壓 - 電源 (Vcc/Vdd): 2.25 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 16x12b
振蕩器型: 外部
工作溫度: -40°C ~ 105°C
封裝/外殼: 160-BGA
包裝: 托盤
Analog-to-Digital Converter (ADC) Parameters
56F8347 Technical Data, Rev.11
Freescale Semiconductor
153
Preliminary
Figure 10-22 ADC Absolute Error Over Processing and Temperature Extremes Before
and After Calibration for VDCin = 0.60V and 2.70V
Note: The absolute error data shown in the graphs above reflects the effects of both gain error and offset
error. The data was taken on 15 parts: five each from four processing corner lots as well as five from one
nominally processed lot, each at three temperatures: -40°C, 27°C, and 150°C (giving the 75 data points
shown above), for two input DC voltages: 0.60V and 2.70V. The data indicates that for the given
population of parts, calibration significantly reduced (by as much as 24%) the collective variation (spread)
of the absolute error of the population. It also significantly reduced (by as much as 38%) the mean
(average) of the absolute error and thereby brought it significantly closer to the ideal value of zero.
Although not guaranteed, it is believed that calibration will produce results similar to those shown above
for any population of parts including those which represent processing and temperature extremes.
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