參數(shù)資料
型號: KAB02D100M-TNGP
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: CONNECTOR ACCESSORY
中文描述: 連接器附件
文件頁數(shù): 59/72頁
文件大?。?/td> 1378K
代理商: KAB02D100M-TNGP
KAB0xD100M - TxGP
Revision 1.11
August 2003
- 59 -
MCP MEMORY
SEC Only
NAND Flash AC Characteristics for Operation
(Vcc
F
=2.7~3.1V, T
A
=-25 to 85
°
C)
NOTE
: 1. If reset command(FFh) is written at Ready state, the device goes into Busy for maximum 5us
Parameter
Symbol
Min
Max
Unit
Data Transfer from Cell to Register
t
R
-
10
μ
s
ALE to RE Delay
t
AR
10
-
ns
CE
F
Access Time
Ready to RE Low
t
CEA
-
45
ns
t
RR
20
-
ns
RE Pulse Width
t
RP
25
-
ns
WE High to Busy
t
WB
-
100
ns
Read Cycle Time
t
RC
50
-
ns
RE Access Time
t
REA
-
30
ns
RE High to Output Hi-Z
t
RHZ
-
30
ns
CE
F
High to Output Hi-Z
RE or CE
F
High to Output Hold
RE High Hold Time
t
CHZ
-
20
ns
t
OH
15
-
ns
t
REH
15
-
ns
Output Hi-Z to RE Low
t
IR
0
-
ns
WE High to RE Low
t
WHR
60
-
ns
Device Resetting Time
(Read/Program/Erase)
t
RST
-
5/10/500
(1)
μ
s
(Vcc
F
=2.7~3.1V, T
A
=-25 to 85
°
C)
Parameter
Symbol
Min
Max
Unit
CLE Set-up Time
t
CLS
0
-
ns
CLE Hold Time
t
CLH
10
-
ns
CE
F
Setup Time
CE
F
Hold Time
WE Pulse Width
t
CS
0
-
ns
t
CH
10
-
ns
t
WP
25
-
ns
ALE Setup Time
t
ALS
0
-
ns
ALE Hold Time
t
ALH
10
-
ns
Data Setup Time
t
DS
20
-
ns
Data Hold Time
t
DH
10
-
ns
Write Cycle Time
t
WC
45
-
ns
WE High Hold Time
t
WH
15
-
ns
NAND
Flash Program/Erase Characteristics
(Vcc
F
=2.7~3.1V, T
A
=-25 to 85
°
C)
Parameter
Symbol
Min
Typ
Max
Unit
Program Time
t
PROG
-
200
500
μ
s
Number of Partial Program Cycles
in the Same Page
Main Array
Nop
-
-
2
cycles
Spare Array
-
-
3
cycles
Block Erase Time
t
BERS
-
2
3
ms
NAND Flash AC Timing Characteristics for Command/Address/Data Input
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