參數(shù)資料
型號(hào): HGTG20N120CND
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類: 功率晶體管
英文描述: 63A, 1200V, NPT Series N-Channel IGBT with Anti-Parallel Hyperfast Diode
中文描述: 63 A, 1200 V, N-CHANNEL IGBT, TO-247
文件頁(yè)數(shù): 3/8頁(yè)
文件大?。?/td> 121K
代理商: HGTG20N120CND
2001 Fairchild Semiconductor Corporation
HGTG20N120CND Rev. B
Current Turn-On Delay Time
t
d(ON)I
IGBT and Diode at T
I
CE
= 20A
V
CE
= 960V
V
GE
= 15V
R
G
= 3
L = 1mH
Test Circuit (Figure 20)
J
= 150
o
C
-
21
26
ns
Current Rise Time
t
rI
-
17
22
ns
Current Turn-Off Delay Time
t
d(OFF)I
-
225
270
ns
Current Fall Time
t
fI
-
340
400
ns
Turn-On Energy
E
ON
-
3.8
5.0
mJ
Turn-Off Energy (Note 3)
E
OFF
-
4.6
5.3
mJ
Diode Forward Voltage
V
EC
I
EC
= 20A
-
2.6
3.2
V
Diode Reverse Recovery Time
t
rr
I
EC
= 20A, dI
EC
/dt = 200A/
μ
s
-
62
75
ns
I
EC
= 2A, dI
EC
/dt = 200A/
μ
s
-
44
55
ns
Thermal Resistance Junction To Case
R
θ
JC
IGBT
-
-
0.32
o
C/W
Diode
-
-
0.75
o
C/W
NOTE:
3. Turn-Off Energy Loss (E
OFF
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
at the point where the collector current equals zero (I
CE
= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
Electrical Specifications
T
C
= 25
o
C, Unless Otherwise Specified
(Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
Typical Performance Curves
Unless Otherwise Specified
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
T
C
, CASE TEMPERATURE (
o
C)
I
C
,
50
0
20
V
GE
= 15V
25
75
100
125
150
40
30
10
50
60
70
V
CE
, COLLECTOR TO EMITTER VOLTAGE (V)
1400
80
0
I
C
,
20
40
600
800
400
200
1000
1200
0
100
120
60
T
J
= 150
o
C, R
G
= 3
, V
GE
= 15V, L = 200
μ
H
HGTG20N120CND
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