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參數(shù)資料
| 型號(hào)： | HFA3860BIV96 |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 無繩電話/電話 |
| 英文描述： | nullDirect Sequence Spread Spectrum Baseband Processor |
| 中文描述： | TELECOM, CELLULAR, BASEBAND CIRCUIT, PQFP48 |
| 文件頁數(shù)： | 34/40頁 |
| 文件大?。?/td> | 272K |
| 代理商： | HFA3860BIV96 |
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4-34
Bits 7:0
Test Bus Address = 10h
NCO Test Hi Rate,
tests the NCO in the high rate tracking section.
Test 7:0 = NCO Accum (19:12)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 11h
FREQ Test Hi Rate,
tests the NCO lag accumulator in the high rate tracking section.
Test 7:0 = Lag Accum (18:11)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 12h
Carrier Phase Error Hi Rate
Test 7:0 = Carrier Phase Error (6,6:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 13h
I_ROT Hi Rate,
tests the I Channel phase rotation error signal.
Test 7:0 = I_ROT (5,5,5:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 14h
Q_ROT Hi Rate
Test 7:0 = Q_ROT (5,5,5:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 15h
I_A/D, Q_A/D,
tests the I and Q Channel 3-bit A/D Converters.
Test 7:6 = 0
Test 5:3 = I_A/D (2:0)
Test 2:0 = Q_A/D (2:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 16h
XOR Hi Rate,
Factory Test Only
Test 7:0 + TEST_CLK = 9 bits of registered XOR test data from the high rate logic.
Bits 7:0
Test Bus Address = 17h
XOR Fast,
Factory Test Only
Test 7:0 + TEST_CLK = 9 bits of registered XOR test data from the low rate logic.
Bits 7:0
Test Bus Address = 18h
Timing Test,
tests the receiver timing.
Test 7 = JMPCLK
Test 6 = JMPCNT
Test 5 = SUBSAMPLECLK
Test 4:0 = MASTERTIM (4:0)
TEST_CLK = Sample CLK
Bits 7:0
Test Bus Address = 19h
A/D Cal Accum Lo,
tests the lo bits of the A/D cal accumulator.
Test 7:0+TestCLK = A/D Cal Accum (8:0)
Bits 7:0
Test Bus Address = 1Ah
A/D Cal Accum Hi,
tests the hi bits of the A/D cal accumulator.
Test 7:0+TestCLK = A/D Cal Accum (17:9)
Bits 7:0
Test Bus Address = 1Bh
Freq Accum Lo,
tests the frequency accumulator of the low rate section.
Test 7:0+TestCLK = Freq Accum (15:7)
Bits 7:0
Test Bus Address = 1Ch
Slow XOR,
Factory Test
Test 7:0 = 8 bits of registered XOR test data from the low rate logic
TEST_CLK = SUBSAMPLECLK
Bits 7:0
Test Bus Address = 1Dh
SQ2 Monitor Hi
- SQ3 if SQ3 used for antenna diversity
Test 7:0 = SQ2 (15:8)
TEST_CLK = pulse after SQ is valid
CONFIGURATION REGISTER 28 ADDRESS (70h) TEST BUS ADDRESS (Continued)
Supplies address for test pin outputs and Test Bus Monitor Register
HFA3860B
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| HFA3861BIN | Direct Sequence Spread Spectrum Baseband Processor |
| HFA3861BIN96 | Direct Sequence Spread Spectrum Baseband Processor |
| HFA3925IA | null2.4GHz - 2.5GHz 250mW Power Amplifier |
| HFA3925IA96 | null2.4GHz - 2.5GHz 250mW Power Amplifier |
| HFA50PA60C | RxxP2xx Series - Econoline Unregulated DC-DC Converters; Input Voltage (Vdc): 05V; Output Voltage (Vdc): 15V; Power: 2W; EN 60950 certified, rated for 250VAC; UL-60950-1 / CSA C22.2 certified; 5.2kVDC Isolation for 1 Minute; Optional Continuous Short Circuit Protected; Wide Operating Temperature Range atfull 2 Watts Load, ?40??C to +85??C; Twin Chamber Transformer System; UL94V-0 Package Material; Efficiency to 80% |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HFA3860IV | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Harris Corporation 功能描述: |
| HFA3860IV WAF | 制造商:Harris Corporation 功能描述: |
| HFA3860IV96 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:11 Mbps Direct Sequence Spread Spectrum Baseband Processor |
| HFA3861 | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processor |
| HFA3861A | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Direct Sequence Spread Spectrum Baseband Processo |
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