參數(shù)資料
型號(hào)： GS1535
英文描述： Multi-rate Reclocker for HD-SDI. SD-SDI & DVB-ASI. 3.3V supply.
中文描述： 多速率時(shí)鐘恢復(fù)器的HD - SDI的。標(biāo)清SDI
文件頁(yè)數(shù)： 35/39頁(yè)
文件大?。?/td> 631K
代理商： GS1535
GENNUM CORPORATION
21498-1
35 of 39
G
3.10.3 Configuration and Status Registers
Table 11 summarizes the GS1532's internal status and
configuration registers.
All of these registers are available to the host via the GSPI
and are all individually addressable.
Where status registers contain less than the full 16 bits of
information however, two or more registers may be
combined at a single logical address.
3.11 JTAG
When the JTAG/HOST input pin of the GS1532 is set HIGH,
the host interface port will be configured for JTAG test
operation. In this mode, pins 27 through 30 become TMS,
TDO, TDI, and TCK. In addition, the RESET_TRST pin will
operate as the test reset pin.
Boundary scan testing using the JTAG interface will be
enabled in this mode.
There are two methods in which JTAG can be used on the
GS1532:
1. As a stand-alone JTAG interface to be used at in-circuit
ATE (Automatic Test Equipment) during PCB assembly;
or
2. Under control of the host for applications such as
system power on self tests.
When the JTAG tests are applied by ATE, care must be
taken to disable any other devices driving the digital I/O
pins. If the tests are to be applied only at ATE, this can be
accomplished with tri-state buffers used in conjunction with
the JTAG/HOST input signal. This is shown in Figure 16.
Figure 16 In-Circuit JTAG
Alternatively, if the test capabilities are to be used in the
system, the host may still cntrol the JTAG/HOST input
signal, but some means for tri-stating the host must exist in
order to use the interface at ATE. This is represented in
Figure 17.
Figure 17 System JTAG
Please contact your Gennum representative to obtain the
BSDL model for the GS1532.
TABLE 11 GS1532 INTERNAL REGISTERS
ADDRESS
REGISTER NAME
SEE SECTION
000h
IOPROC_DISABLE
Section 3.6.3
002h
EDH_FLAG
Section 3.6.3.3
004h
VIDEO_STANDARD
Section 3.6.2
010h - 011h
VIDEO_FORMAT
Section 3.6.3.1
014h - 017h
RASTER_STRUCTURE
Section 3.6.2
018h - 025h
EDH_CALC_RANGES
Section 3.6.3.3
027h - 028h
LINE_352M
Section 3.6.3.1
Application HOST
GS1532
CS_TMS
SCLK_TCK
SDIN_TDI
SDOUT_TDO
JTAG_HOST
In-circuit ATE probe
Application HOST
GS1532
CS_TMS
SCLK_TCK
SDIN_TDI
SDOUT_TDO
JTAG_HOST
In-circuit ATE probe
Tri-State
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