參數(shù)資料
型號: DDP3310B
廠商: MICRONAS SEMICONDUCTOR HOLDING AG
元件分類: 消費(fèi)家電
英文描述: Display and Deflection Processor
中文描述: SPECIALTY CONSUMER CIRCUIT, PQCC68
封裝: PLASTIC, LCC-68
文件頁數(shù): 27/60頁
文件大?。?/td> 1540K
代理商: DDP3310B
ADVANCE INFORMATION
DDP 3310B
Micronas
27
SCAN VELOCITY MODULATION
h
1A7
16-r/w
video mode coefficients
bit [5:0]
bit [8:6]
0...63
0...6
gain
differentiator delay (0= filter off)
60
1
SVM1
SVG
SVD
h
19F
16-r/w
limiter
bit [7:0]
bit [8:5]
0...255
0
limit value
not used, set to
0
100
0
SVLIM
h
19B
16-r/w
delay and coring
bit [3:0]
0...15
delay of SVMOUT in steps of 12.5 ns
(7 = SVMOUT vs. RGBOUT is 60ns)
coring value
not used, set to
0
bit [7:4]
bit [8]
0...15
0
7
0
SVM2
SVDEL
SVCOR
TUBE MEASUREMENT
h
19C
16-r/w
tube measurement line
bit [8:0]
0..511
start line for tube measurement (+2 lines)
10
TML
h
15F
16-r/w
bit[10:0]
0... 1295
Latch timing of madc data in pixels before
the begin of horiz. blanking HBST
128
MADCLAT
h
186
16-r/w
white drive measurement control
bit [8:0]
0..511
RGB amplitude for white-drive beam cur-
rent measurement
384
WDRM
h
168
16-r/w
bit[14:6]
0..511
Amplitude for cutoff measurement.
It can be set to measure at higher cutoff
current.
256
IBRM
h
171
16-r/w
measurement control word
bit [8]
0/1
bit [9]
0/1
enable/disable ultra black blanking
0: all outputs blanked (video mute)
1: normal mode
78/156 kHz bandwidth for cutoff and drive
measurement
enable/disable white drive measurement
enable/disable cutoff measurement
disable/enable horizontal blanking during
measurement
disable/enable RSW1 Pin as input for beam
current measurement
bit [10]
0/1
bit [11]
bit [12]
bit [13]
0/1
0/1
0/1
bit [14]
0/1
0
0
0
0
0
0
0
MCTRL
ULBLK_DIS
BLANK_DIS
BW_SEL
WDR_DIS
CUT_DIS
MBLANK
SMODE
Table 3
3:
Control Registers of the XDFP, continued
XDFP Control and Status Registers
Subaddr.
Mode
Function
Default
Name
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