參數(shù)資料
型號: CD40103BMS
廠商: Intersil Corporation
元件分類: 通用總線功能
英文描述: CMOS 8-Stage Presettable Synchronous Down Counters(CMOS 8級可預置同步減計數(shù)器)
中文描述: 的CMOS 8級可預置計數(shù)器同步跌的CMOS(8級可預置同步減計數(shù)器)
文件頁數(shù): 6/13頁
文件大?。?/td> 166K
代理商: CD40103BMS
7-1299
Specifications CD40102BMS, CD40103BMS
Functional Diagram
CD40102BMS, CD40103BMS
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
±
-0.5V
OSCILLATOR
50kHz
25kHz
PART NUMBER CD40102BMS, CD40103BMS
Static Burn-In 1
Note 1
14
1 - 13, 15
16
Static Burn-In 2
Note 1
14
8
1 - 7, 9 - 13, 15, 16
Dynamic Burn-
In Note 1
-
3, 8, 15
2, 16
14
1, 4, 6, 11, 13
5, 7, 9, 10, 12
Irradiation
Note 2
-
NOTES:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
±
0.5V
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
SPE
APE
CI/CE
CLR
JAM
J0
J7
CLOCK
C0/ZD
8 - STAGE
DOWN
COUNTER
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