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參數(shù)資料
| 型號： | 74F50729 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Synchronizing dual D-type flip-flop with edge-triggered set and reset with metastable immune characteristics |
| 中文描述： | 同步雙D型觸發(fā)器具有邊觸發(fā)器觸發(fā)并以穩(wěn)免疫特色復(fù)位 |
| 文件頁數(shù)： | 7/12頁 |
| 文件大小： | 94K |
| 代理商： | 74F50729 |
Philips Semiconductors
Product specification
74F50729
Synchronizing dual D-type flip-flop with edge-triggered
set and reset and metastable immune characteristics
1990 Sep 14
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TY.
2
UNIT
CONDITIONS
1
MIN
MAX
V
OH
High-level output voltage
V
CC
= MIN, V
IH
= MIN
I
OH
= MAX
±
10%V
CC
±
5%V
CC
2.5
V
V
IL
= MAX,
2.7
3.4
V
I
=
–15mA
±
5%V
CC
2.0
V
V
OL
Low-level output voltage
V
= MIN, V
IL
=
MAX,
I
OL
= MAX
±
10%V
CC
0.30
0.50
V
V
IH
= MIN
±
5%V
CC
0.30
0.50
V
V
IK
I
I
I
IH
I
IL
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
-0.73
-1.2
V
μ
A
Input current at maximum input voltage
100
High–level input current
20
μ
A
μ
A
μ
A
Low–level input current
Dn
-250
CPn, SDn, RDn
–20
I
OS
I
CC
Short–circuit output current
3
Supply current
4
(total)
V
CC
= MAX, V
O
= 2.25V
V
CC
= MAX
-60
-150
mA
19
27
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type
and function table for operating mode.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Measure I
CC
with the clock input grounded and all outputs open, then with Q and Q outputs high in turn.
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25
°
C
T
amb
= 0
°
C to
+70
°
C
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
MIN
T
amb
= –40
°
C to +85
°
C
SYMBOL
PARAMETER
TEST
V
CC
= +5.0V
C
L
= 50pF,
R
L
= 500
MIN
TYP
V
CC
= +5.0V
±
10%
C
L
= 50pF,
R
L
= 500
MIN
UNIT
CONDITION
MAX
MAX
MAX
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
ok(o)
NOTES:
1. | t
actual –t
actual | for any one output compared to any other output where N and M are either LH or HL.
2. Skew lines are valid only under same conditions (temperature, V
CC
, loading, etc.,).
Maximum clock frequency
Waveform 1
105
120
85
75
ns
Propagation delay
CPn to Qn or Qn
Waveform 1
2.0
2.0
3.9
3.9
6.0
6.0
1.5
2.0
6.5
6.5
1.5
2.0
7.0
6.5
ns
Propagation delay
SDn RDn
to Qn or Qn
Output skew
1, 2
Waveform 2
2.0
3.0
4.0
5.0
6.5
7.5
1.5
2.0
7.5
8.0
1.5
2.0
7.5
8.0
ns
Waveform 4
1.5
1.5
1.5
ns
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