參數(shù)資料
型號(hào)： TMX320F28069UPFPA
廠商： Texas Instruments
文件頁數(shù)： 101/174頁
文件大?。?/td> 0K
描述： IC MCU 32BIT 128KB FLASH 80HTQFP
產(chǎn)品培訓(xùn)模塊： ControlSUITE
Piccolo F2806x
標(biāo)準(zhǔn)包裝： 1
系列： TMS320F2806x, Piccolo™, C2000™
核心處理器： C28x
芯體尺寸： 32-位
速度： 80MHz
連通性： CAN，I²C，McBSP，SCI，SPI，UART/USART
外圍設(shè)備： 欠壓檢測/復(fù)位，DMA，POR，PWM，WDT
輸入/輸出數(shù)： 40
程序存儲(chǔ)器容量： 256KB（128K x 16）
程序存儲(chǔ)器類型： 閃存
RAM 容量： 50K x 16
電壓 - 電源 (Vcc/Vdd)： 1.71 V ~ 1.995 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 12x12b
振蕩器型： 內(nèi)部
工作溫度： -40°C ~ 85°C
封裝/外殼： 80-TQFP 裸露焊盤
包裝： 托盤
其它名稱： 296-30085
TMX320F28069UPFPA-ND
SPRS698D – NOVEMBER 2010 – REVISED DECEMBER 2012
2.5.5
Peripheral Bus
To enable migration of peripherals between various Texas Instruments (TI) MCU family of devices, the
devices adopt a peripheral bus standard for peripheral interconnect. The peripheral bus bridge multiplexes
the various busses that make up the processor Memory Bus into a single bus consisting of 16 address
lines and 16 or 32 data lines and associated control signals. Three versions of the peripheral bus are
supported. One version supports only 16-bit accesses (called peripheral frame 2). Another version
supports both 16- and 32-bit accesses (called peripheral frame 1).
2.5.6
Real-Time JTAG and Analysis
The devices implement the standard IEEE 1149.1 JTAG (1) interface for in-circuit based debug.
Additionally, the devices support real-time mode of operation allowing modification of the contents of
memory, peripheral, and register locations while the processor is running and executing code and
servicing interrupts. The user can also single step through non-time-critical code while enabling time-
critical interrupts to be serviced without interference. The device implements the real-time mode in
hardware within the CPU. This is a feature unique to the 28x family of devices, requiring no software
monitor. Additionally, special analysis hardware is provided that allows setting of hardware breakpoint or
data/address watch-points and generating various user-selectable break events when a match occurs.
These devices do not support boundary scan; however, IDCODE and BYPASS features are available if
the following considerations are taken into account. The IDCODE does not come by default. The user
needs to go through a sequence of SHIFT IR and SHIFT DR state of JTAG to get the IDCODE. For
BYPASS instruction, the first shifted DR value would be 1.
2.5.7
Flash
The F28069, F28068, F28067, and F28066 devices contain 128K x 16 of embedded flash memory,
segregated into eight 16K x 16 sectors. The F28065, F28064, F28063, and F28062 devices contain 64K x
16 of embedded flash memory, segregated into eight 8K x 16 sectors. All devices also contain a single
1K x 16 of OTP memory at address range 0x3D 7800 – 0x3D 7BF9. The user can individually erase,
program, and validate a flash sector while leaving other sectors untouched. However, it is not possible to
use one sector of the flash or the OTP to execute flash algorithms that erase or program other sectors.
Special memory pipelining is provided to enable the flash module to achieve higher performance. The
flash/OTP is mapped to both program and data space; therefore, it can be used to execute code or store
data information. Addresses 0x3F 7FF0 – 0x3F 7FF5 are reserved for data variables and should not
contain program code.
NOTE
The Flash and OTP wait-states can be configured by the application. This allows applications
running at slower frequencies to configure the flash to use fewer wait-states.
Flash effective performance can be improved by enabling the flash pipeline mode in the
Flash options register. With this mode enabled, effective performance of linear code
execution will be much faster than the raw performance indicated by the wait-state
configuration alone. The exact performance gain when using the Flash pipeline mode is
application-dependent.
For more information on the Flash options, Flash wait-state, and OTP wait-state registers,
see the "Systems Control and Interrupts" chapter of the TMS320x2806x Piccolo Technical
Reference Manual (literature number SPRUH18).
(1)
IEEE Standard 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture
32
Device Overview
Copyright 2010–2012, Texas Instruments Incorporated
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