參數(shù)資料
型號: TMS417409ADJ-60
廠商: National Semiconductor Corporation
英文描述: 4194304 BY 4-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES
中文描述: 4194304 4位擴展數(shù)據(jù)輸出動態(tài)隨機存取存儲器
文件頁數(shù): 7/37頁
文件大?。?/td> 515K
代理商: TMS417409ADJ-60
TMS416409A, TMS417409A, TMS426409A, TMS427409A
4194304 BY 4-BIT EXTENDED DATA OUT
DYNAMIC RANDOM-ACCESS MEMORIES
SMKS893B – AUGUST 1996 – REVISED APRIL 1997
7
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
test mode (continued)
Test Mode Cycle
Entry Cycle
Exit Cycle
Normal
Mode
RAS
CAS
W
NOTE A: The states of W, data in, and address are defined by the type of cycle used during test mode.
Figure 1. Test-Mode Cycle
相關PDF資料
PDF描述
TMS417409A 4194304 BY 4-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES
TMS426409A 4194304 BY 4-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES
TMS427409A 4194304 BY 4-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES
TMS427409ADGA-60 4194304 BY 4-BIT EXTENDED DATA OUT DYNAMIC RANDOM-ACCESS MEMORIES
TMS4416 16,384 WORD BY 4 BIT DYNAMIC RAM
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