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參數(shù)資料
| 型號： | TDA8769 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | 12-bit, 60/80/105 Msps Analog-to-Digital Converter (ADC) Nyquist/high IF sampling |
| 中文描述： | 12位，60/80/105 Msps的模擬到數(shù)字轉(zhuǎn)換器（ADC）奈奎斯特/ IF采樣高 |
| 文件頁數(shù)： | 21/28頁 |
| 文件大?。?/td> | 217K |
| 代理商： | TDA8769 |
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2003 Dec 09
21
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
11.5
Definitions
11.5.1
S
TATIC PARAMETERS
11.5.1.1
Integral non-linearity (INL)
INL is defined as the deviation of the transfer function from
a best fit straight line (linear regression computation). The
INL of code i is obtained from the following equation:
where:
i = code value
V
in
= input voltage for code i
S = slope of the ideal straight line (code width).
11.5.1.2
Differential non-linearity (DNL)
DNL is the deviation in code width from the value of one
LSB. The DNL of code i is obtained from the following
equation:
where:
i = 0 to 2
n
2
V
in
= input voltage for code i
S = slope of the ideal straight line.
11.5.2
D
YNAMIC PARAMETERS
Figure 15 shows the spectrum of a single tone full-scale
input sine wave with frequency f
t
, conforming to coherent
sampling and digitized by the ADC under test. Coherent
f
t
f
s
sampling means that
, where M is the number of
cycles, N the number of samples and both M and N being
a relative prime.
Remark:
The parameter P
noise
used in the following
equations includes the power of the random noise,
non-linearities, sampling time errors and quantization
noise.
INL i
( )
V
i
( )
--------------------S
V
ideal
(
)
–
=
DNL i
( )
V
i
-------------------S
1
+
(
)
V
i
( )
–
=
---
M
=
handbook, full pagewidth
MBL882
0
measured output range (MHz)
2.5
magnitude
20
40
60
80
100
120
160
5
7.5
10
12.5
15
17.5
20
22.5
25
27
140
IMD3
Fig.15 Spectrum of a full-scale input sine wave with frequency f
t
.
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