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參數(shù)資料
| 型號： | TC253SPD-30 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | Impactron High Sensitivity CCD (Non-Cooled) |
| 中文描述： | Impactron 高靈敏度 CCD（非冷卻） |
| 文件頁數(shù)： | 7/21頁 |
| 文件大小： | 286K |
| 代理商： | TC253SPD-30 |
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JULY 2003 SOCS085
7
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
serial register and charge multiplier
The serial register is used for transporting charge stored in the memory pixels to the output amplifier. However,
the TC253SPD-30 device has a serial register with twice the standard length. The first half has a conventional
design that interfaces with the memory and the clearing drain as it would in any other CCD sensor (for example
the TC237 sensor). The second half, however, is unique and includes 400 charge-multiplication stages with a
number of dummy pixels that are required to transport charge between the active register blocks and the output
amplifier. Charge is multiplied as it progresses from stage to stage in the multiplier toward the charge detection
node. The charge multiplication level depends on the amplitude of the multiplication pulses (approximately
11 V~15 V) applied to the multiplication gates. Due to the double length of the register, the first line in the field
or frame scan does not contain valid data and is to be discarded.
readout and video processing
The charge detection node uses standard floating diffusion (FD) concepts followed by dual stage source
followers as buffer amplifiers. The reset gate is internally connected to SRG1. This results in simultaneous FD
resets when the SRG1 gate is clocked high. To achieve ultimate sensor performance, it is necessary to eliminate
kTC noise using CDS processing techniques. The IMPACTRON
devices can detect single photons when
cooled or when sufficiently short integration times are used.
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range, V
SS
: ADB (see Note1)
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Supply voltage range, V
SS
: ODB
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
: IAG, SAG, SRG2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
: SRG1
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
: CMG
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
STG
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating case temperature range, T
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to substrate terminal (SUB).
SUB to SUB + 15 V
SUB to SUB + 20 V
8 V to + 8 V
5 V to + 8 V
5 V to + 15 V
10
°
C to 45
°
C
30
°
C to 85
°
C
10
°
C to 55
°
C
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