參數(shù)資料
型號(hào)： SN74BCT8373NT
廠(chǎng)商： TEXAS INSTRUMENTS INC
元件分類(lèi)： 總線(xiàn)收發(fā)器
英文描述： BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
文件頁(yè)數(shù)： 4/21頁(yè)
文件大?。?/td> 287K
代理商： SN74BCT8373NT
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DTYPE LATCHES
SCBS471 JUNE 1990 REVISED JUNE 1994
212
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a boundary-run test operation to specify which test operation is to be
executed.
boundary-control-register opcode description
The BCR opcodes are decoded from BCR bits 1 0 as shown in Table 3. The selected test operation is
performed while the RUNT instruction is executed in the Run-Test/Idle state. The following descriptions detail
the operation of each BCR instruction and illustrate the associated PSA and PRPG algorithms.
Table 3. Boundary-Control-Register Opcodes
BINARY CODE
BIT 1
→ BIT 0
MSB
→ LSB
DESCRIPTION
00
Sample inputs/toggle outputs (TOPSIP)
01
Pseudo-random pattern generation / 16-bit mode (PRPG)
10
Parallel-signature analysis / 16-bit mode (PSA)
11
Simultaneous PSA and PRPG / 8-bit mode (PSA/PRPG)
It should be noted, in general, that while the control input BSCs (bits 17 16) are not included in the sample,
toggle, PSA, or PRPG algorithms, the output-enable BSC (bit 16 of the BSR) does control the drive state (active
or high impedance) of the device output terminals.
sample inputs / toggle outputs (TOPSIP)
Data appearing at the device input terminals is captured in the shift-register elements of the input BSCs on each
rising edge of TCK. This data is then updated in the shadow latches of the input BSCs and applied to the inputs
of the normal on-chip logic. Data in the shift register elements of the output BSCs is toggled on each rising edge
of TCK, updated in the shadow latches, and applied to the device output terminals on each falling edge of TCK.
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PDF描述
SN74BCT8374ADWRG4 BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8374ADW 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWE4 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWG4 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWR 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWRE4 功能描述:特定功能邏輯 Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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