參數(shù)資料
型號(hào)： SN74BCT8373NT
廠商： TEXAS INSTRUMENTS INC
元件分類(lèi)： 總線(xiàn)收發(fā)器
英文描述： BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
文件頁(yè)數(shù)： 16/21頁(yè)
文件大?。?/td> 287K
代理商： SN74BCT8373NT
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DTYPE LATCHES
SCBS471 JUNE 1990 REVISED JUNE 1994
24
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Terminal Functions
TERMINAL
NAME
DESCRIPTION
1D 8D
Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high level if left
unconnected.
GND
Ground
LE
Normal-function latch-enable input. See function table for normal-mode logic. An internal pullup forces LE to a high level if
left unconnected.
OE
Normal-function output-enable input. See function table for normal-mode logic. An internal pullup forces OE to a high level
if left unconnected.
1Q 8Q
Normal-function data outputs. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces
TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active
and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional test reset
signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high (VIHH), at TMS.
VCC
Supply voltage
相關(guān)PDF資料
PDF描述
SN74BCT8374ADWRG4 BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
SN74BCT8374ANT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
SN74CB3Q16210DGVR CB3Q/3VH/3C/2B SERIES, DUAL 10-BIT DRIVER, TRUE OUTPUT, PDSO48
SN74CB3Q16811DLR CB3Q/3VH/3C/2B SERIES, DUAL 12-BIT DRIVER, TRUE OUTPUT, PDSO56
SN74CB3Q3244GQNR CB3Q/3VH/3C/2B SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, PBGA20
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8374ADW 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWE4 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWG4 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWR 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374ADWRE4 功能描述:特定功能邏輯 Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫(xiě)一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*