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參數(shù)資料
| 型號： | SN74BCT8373NT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24 |
| 文件頁數(shù)： | 1/21頁 |
| 文件大?。?/td> | 287K |
| 代理商： | SN74BCT8373NT |
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DTYPE LATCHES
SCBS471 JUNE 1990 REVISED JUNE 1994
Copyright
1994, Texas Instruments Incorporated
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POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
Member of the Texas Instruments SCOPE
Family of Testability Products
Octal Test-Integrated Circuit
Functionally Equivalent to SN74F373 and
SN74BCT373 in the Normal-Function Mode
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Test Operation Synchronous to Test
Access Port (TAP)
Implements Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
SCOPE Instruction Set
IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
Parallel-Signature Analysis at Inputs
Pseudo-Random Pattern Generation
From Outputs
Sample Inputs / Toggle Outputs
Package Options Include Plastic
Small-Outline (DW) Packages and
Standard Plastic 300-mil DIPs (NT)
description
The SN74BCT8373 scan test device with octal D-type latches is a member of the Texas Instruments SCOPE
testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan
to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via
the 4-wire test access port (TAP) interface.
In the normal mode, this device is functionally equivalent to the SN74F373 and SN74BCT373 octal D-type
latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the
device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE
octal latches.
In the test mode, the normal operation of the SCOPE
octal latches is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN74BCT8373 is characterized for operation from 0
°C to 70°C.
SCOPE is a trademark of Texas Instruments Incorporated.
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LE
1Q
2Q
3Q
4Q
GND
5Q
6Q
7Q
8Q
TDO
TMS
OE
1D
2D
3D
4D
5D
VCC
6D
7D
8D
TDI
TCK
DW OR NT PACKAGE
(TOP VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8374ADW | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ADWE4 | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ADWG4 | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ADWR | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374ADWRE4 | 功能描述:特定功能邏輯 Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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