參數(shù)資料
型號(hào)： SN74BCT8373ADWR
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
封裝： PLASTIC, SO-24
文件頁數(shù)： 25/26頁
文件大?。?/td> 487K
代理商： SN74BCT8373ADWR
SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES
WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
8
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
register overview
With the exception of the bypass register, any test register may be thought of as a serial shift register with a
shadow latch on each bit. The bypass register differs in that it contains only a shift register. During the
appropriate capture state (Capture-IR for instruction register, Capture-DR for data registers), the shift register
may be parallel loaded from a source specified by the current instruction. During the appropriate shift state
(Shift-IR or Shift-DR), the contents of the shift register are shifted out from TDO while new contents are shifted
in at TDI. During the appropriate update state (Update-IR or Update-DR), the shadow latches are updated from
the shift register.
instruction register description
The instruction register (IR) is eight bits long and tells the device what instruction is to be executed. Information
contained in the instruction includes the mode of operation (either normal mode, in which the device performs
its normal logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation
to be performed, which of the three data registers is to be selected for inclusion in the scan path during
data-register scans, and the source of data to be captured into the selected data register during Capture-DR.
Table 2 lists the instructions supported by the
′BCT8373A. The even-parity feature specified for SCOPE
devices is not supported in this device. Bit 7 of the instruction opcode is a don’t-care bit. Any instructions that
are defined for SCOPE
devices but are not supported by this device default to BYPASS.
During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted
out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value
that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated,
and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the
binary value 11111111, which selects the BYPASS instruction. The IR order of scan is shown in Figure 2.
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
TDO
TDI
Bit 7
(MSB)
Don’t
Care
Bit 0
(LSB)
Figure 2. Instruction Register Order of Scan
相關(guān)PDF資料
PDF描述
SN74BCT8373NT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
SN74BCT8374ADWRG4 BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
SN74BCT8374ANT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
SN74CB3Q16210DGVR CB3Q/3VH/3C/2B SERIES, DUAL 10-BIT DRIVER, TRUE OUTPUT, PDSO48
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8373ADWRE4 功能描述:特定功能邏輯 Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ADWRG4 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Scan Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ANT 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ANTE4 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373DW 制造商:Rochester Electronics LLC 功能描述:- Bulk
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