參數(shù)資料
型號(hào)： SN74BCT8373ADWR
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
封裝： PLASTIC, SO-24
文件頁(yè)數(shù)： 21/26頁(yè)
文件大?。?/td> 487K
代理商： SN74BCT8373ADWR
SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES
WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
1D – 8D
Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high level if
left unconnected.
GND
Ground
LE
Normal-function latch-enable input. See function table for normal-mode logic. An internal pullup forces LE to a high level if
left unconnected.
OE
Normal-function output-enable input. See function table for normal-mode logic. An internal pullup forces OE to a high level
if left unconnected.
1Q – 8Q
Normal-function data outputs. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces
TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active
and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected. The TMS pin also provides the optional
test reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double-high (VIHH),
at TMS.
VCC
Supply voltage
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8373ADWRE4 功能描述:特定功能邏輯 Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ADWRG4 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Scan Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ANT 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373ANTE4 功能描述:特定功能邏輯 Device w/Octal D-Type Latches RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8373DW 制造商:Rochester Electronics LLC 功能描述:- Bulk
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