參數(shù)資料
型號: SN74BCT8373ADWR
廠商: TEXAS INSTRUMENTS INC
元件分類: 總線收發(fā)器
英文描述: BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24
封裝: PLASTIC, SO-24
文件頁數(shù): 12/26頁
文件大?。?/td> 487K
代理商: SN74BCT8373ADWR
SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES
WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test terminals are used to control the operation of the test circuitry: test data input (TDI), test
data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry can perform
other testing functions such as parallel signature analysis (PSA) on data inputs and pseudo-random pattern
generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54BCT8373A is characterized for operation over the full military temperature range of – 55
°C to 125°C.
The SN74BCT8373A is characterized for operation from 0
°C to 70°C.
FUNCTION TABLE
(normal mode, each latch)
INPUTS
OUTPUT
OE
LE
D
Q
L
H
L
HL
L
LX
Q0
H
X
Z
logic symbol
SCAN
’BCT8373A
1D
23
1D
1Q
2
TDI
14
TDI
TCK-IN
EN
24
22
2D
2Q
3
TMS
12
TMS
13
TCK
C1
1
LE
TCK-OUT
21
3D
3Q
4
20
4D
4Q
5
19
5D
5Q
7
17
6D
6Q
8
16
7D
7Q
9
15
8D
8Q
10
OE
Φ
TDO
11
TDO
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DW, JT, and NT packages.
相關(guān)PDF資料
PDF描述
SN74BCT8373NT BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
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