I
參數(shù)資料
型號(hào)： SMARTPSE24-KIT
廠商： Silicon Laboratories Inc
文件頁數(shù)： 33/36頁
文件大?。?/td> 0K
描述： KIT EVAL REF 24PORT SPI/UART
標(biāo)準(zhǔn)包裝： 1
主要目的： 電源管理，以太網(wǎng)供電（POE），PSE
已用 IC / 零件： Si3452，Si3482，Si3500
已供物品： 板，線纜，CD
相關(guān)產(chǎn)品： SI3482-A01-GM-ND - IC CTLR POE 24-48PORT PSE 24-QFN
336-1830-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1835-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1829-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1831-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1834-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1844-5-ND - IC POE SWITCH PWR OVER LAN 20QFN
336-1833-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
336-1832-5-ND - IC POE CONTROLLER MIDSPAN 40QFN
Si3452
6
Rev. 1.3
Table 4. Detection Specifications
Description
Symbol
Test Conditions
Min
Typ
Max
Unit
Detection Current Limit
ILIM_DET
Measured with DETn
shorted to GND
—3
5
mA
Detection Voltage,
when RDET =25k
VDET1
VDET2
VDET3
—
–10.0
—
–4.0
–8.0
–4.0
–2.8
—
–2.8
V
Detection Slew Rate
—
0.1
V/μs
Detection Probe Duration
TPROBE
10
—
30
ms
Detection Probe Cycle Time
TDET
——
500
ms
Minimum Valid Signature Resistance
RDET_MIN
15
—
19
k
Maximum Valid Signature Resistance
RDET_MAX
26.5
—
33
k
Resistance at which Open Circuit is
Declared
ROPEN
100
—
400
k
Resistance at which Short Circuit is
Declared
RSHORT
150
—
400
W
Valid Detect Capacitance
CDET_VALID
——
150
nF
Invalid Detect Capacitance
CDET_INVALD
10
—
μF
Table 5. Classification Specifications
Description
Symbol
Test Conditions
Min
Typ
Max
Unit
Class Event Voltage
VCLASS
0mA < IPort < 45 mA
–20.5
—
–15.5
V
Mark Event Voltage
VMARK
0mA < IPort < 5 mA
–7
—
–10
V
Classification Current
Limit
ILIM_CLASS
Measured with DETn shorted to
GND
51
—
100
mA
Classification Current
Regions
Class 0
Class 1
Class 2
Class 3
Class 4
Overcurrent
0
8
16
25
35
51
—
5
13
21
31
45
—
mA
Classification Delay
TCLASS_DLY
Time from end of valid detect cycle
to classification begin
—5—
ms
Classification Event
Time
TCLE
Width of valid VCLASS probe for 1-
Event or 2-Event classification
10
—
30
ms
Mark Event Time
TME
Width of mark between classification
events
—8—
ms
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