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RC4227
PRODUCT SPECIFICATION
5
Typical Performance Characteristics
Figure 1. 0.1 Hz to 10 Hz Noise Test Circuit (1/2 Shown)
Figure 2. 0.1Hz to 10Hz Noise Gain vs. Frequency
Figure 3. Open Loop Gain vs. Frequency
Figure 4. Gain, Phase Shift vs. Frequency
Figure 5. Slew Rate, Gain Bandwidth Product,
Phase Margin vs. Temperature
65-3469-01
0.1
μ
F
100K
2K
100K
4.3K
2.2
μ
F
0.1 F
4.7
μ
F
10
24.3K
1/2
4227
D.U.T
22
μ
F
110K
Scope
x1
R
IN
= 1M
μ
1
2
3
3
2
OP-07
Notes:
1. Peak-to-peak noise measured in a 10-second interval.
2. The device under test should be warmed up for 3 minutes and shielded from air currents.
3. Voltage gain = 50,000.
6
A
V
F (Hz)
6
0.01
0.1
1.0
10
100
Test Time of 10 Sec Further
Limits Low Frequency (<0.1 Hz)
Gain
100
90
80
70
60
50
40
30
6
A
V
F (Hz)
110
90
70
50
30
10
-10
1
10
100
1K
10K 100K
1M
10M 100M
130
65-0006
A
V
F
M
F (MHz)
25
20
16
10
5
0
-5
-10
1
10
100
80
100
120
140
160
180
200
220
f
A
V
V = 15V
T = +25 C
F
M
= 70
65-0007
F
M
S
G
T
A
(
C)
70
60
50
4
3
2
-75
-50
-25
0
25
75
100
125
50
10
9
8
7
6
M
GBW
SL
V = +15V
f
m