參數(shù)資料
型號: K1S3216B1C
廠商: SAMSUNG SEMICONDUCTOR CO. LTD.
英文描述: 2Mx16 bit Uni-Transistor Random Access Memory
中文描述: 2Mx16位統(tǒng)一晶體管隨機存取存儲器
文件頁數(shù): 5/10頁
文件大?。?/td> 180K
代理商: K1S3216B1C
Revision 0.1
June 2003
K1S3216B1C
- 5 -
U
t
RAM
Preliminary
RECOMMENDED DC OPERATING CONDITIONS
1)
1. T
A
=-40 to 85
°
C, otherwise specified.
2. Overshoot: Vcc+1.0V in case of pulse width
20ns.
3. Undershoot: -1.0V in case of pulse width
20ns.
4. Overshoot and undershoot are sampled, not 100% tested.
Item
Symbol
Min
Typ
Max
Unit
Supply voltage
Vcc
1.7
1.8/2.0
2.1
V
Ground
Vss
0
0
0
V
Input high voltage
V
IH
1.4
-
V
CC
+0.2
2)
V
Input low voltage
V
IL
-0.2
3)
-
0.4
V
CAPACITANCE
1)
(f=1MHz, T
A
=25
°
C)
1. Capacitance is sampled, not 100% tested.
Item
Symbol
Test Condition
Min
Max
Unit
Input capacitance
C
IN
V
IN
=0V
-
8
pF
Input/Output capacitance
C
IO
V
IO
=0V
-
10
pF
DC AND OPERATING CHARACTERISTICS
Item
Symbol
Test Conditions
Min
Typ
Max
Unit
Input leakage current
I
LI
V
IN
=Vss to Vcc
-1
-
1
μ
A
Output leakage current
I
LO
CS
1
=V
IH
or CS
2
=V
IL
or OE=V
IH
or WE=V
IL
or LB=UB=V
IH
,
V
IO
=Vss to Vcc
-1
-
1
μ
A
Average operating current
I
CC1
Cycle time=1
μ
s, 100% duty, I
IO
=0mA, CS
1
0.2V, LB
0.2V
or/and UB
0.2V, CS
2
V
CC
-
0.2V, V
IN
0.2V or V
IN
V
CC
-
0.2V
Cycle time=Min, I
IO
=0mA
,
100% duty,
CS
1
=V
IL,
CS
2
=
V
IH
LB=V
IL
or/and UB=V
IL
, V
IN
=V
IH
or V
IL
-
-
5
mA
I
CC2
-
-
30
mA
Output low voltage
V
OL
I
OL
= 0.1mA
-
-
0.2
V
Output high voltage
V
OH
I
OH
= -0.1mA
1.4
-
-
V
Standby Current(CMOS)
I
SB1
Other inputs=0~Vcc
1) CS
1
V
CC
-0.2V
,
CS
2
V
CC
-
0.2V(CS
1
controlled) or
2) 0V
CS
2
0.2V(CS
2
controlled)
-
-
100
μ
A
PRODUCT LIST
Industrial Temperature Products(-40~85
°
C)
Part Name
Function
K1S3216B1C-FI70
K1S3216B1C-FI85
48-FBGA, 70ns, 1.8V/2.0V
48-FBGA, 85ns, 1.8V/2.0V
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