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參數(shù)資料
| 型號： | ADC0804LCN |
| 廠商： | Intersil |
| 文件頁數(shù)： | 4/17頁 |
| 文件大小： | 0K |
| 描述： | IC ADC 8-BIT 10KSPS 1LSB 20-DIP |
| 標準包裝： | 1,080 |
| 位數(shù)： | 8 |
| 采樣率（每秒）： | 10k |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉(zhuǎn)換器數(shù)目： | 1 |
| 電壓電源： | 單電源 |
| 工作溫度： | 0°C ~ 70°C |
| 安裝類型： | 通孔 |
| 封裝/外殼： | 20-DIP（0.300"，7.62mm） |
| 供應(yīng)商設(shè)備封裝： | 20-PDIP |
| 包裝： | 管件 |
| 輸入數(shù)目和類型： | 1 個差分，單極 |
| 其它名稱： | ADC0804LCNIN ADC0804LCNIN-ND |
12
Finally, if time is short and capacitive loading is high, external
bus drivers must be used. These can be three-state buffers
(low power Schottky is recommended, such as the 74LS240
series) or special higher-drive-current products which are
designed as bus drivers. High-current bipolar bus drivers
with PNP inputs are recommended.
Power Supplies
Noise spikes on the V+ supply line can cause conversion
errors as the comparator will respond to this noise. A
low-inductance tantalum filter capacitor should be used
close to the converter V+ pin, and values of 1
F or greater
are recommended. If an unregulated voltage is available in
the system, a separate 5V voltage regulator for the converter
(and other analog circuitry) will greatly reduce digital noise
on the V+ supply. An lCL7663 can be used to regulate such
a supply from an input as low as 5.2V.
Wiring and Hook-Up Precautions
Standard digital wire-wrap sockets are not satisfactory for
breadboarding with this A/D converter. Sockets on PC
boards can be used. All logic signal wires and leads should
be grouped and kept as far away as possible from the
analog signal leads. Exposed leads to the analog inputs can
cause undesired digital noise and hum pickup; therefore,
shielded leads may be necessary in many applications.
A single-point analog ground should be used which is
separate from the logic ground points. The power supply
bypass capacitor and the self-clockIng capacitor (if used)
should both be returned to digital ground. Any VREF/2
bypass capacitors, analog input filter capacitors, or input
signal shielding should be returned to the analog ground
point. A test for proper grounding is to measure the zero
error of the A/D converter. Zero errors in excess of 1/4 LSB
can usually be traced to improper board layout and wiring
(see Zero Error for measurement). Further information can
be found in Application Note AN018.
Testing the A/D Converter
There are many degrees of complexity associated with testing
an A/D converter. One of the simplest tests is to apply a
known analog input voltage to the converter and use LEDs to
display the resulting digital output code as shown in Figure 18.
For ease of testing, the VREF/2 (pin 9) should be supplied
with 2.560V and a V+ supply voltage of 5.12V should be
used. This provides an LSB value of 20mV.
If a full scale adjustment is to be made, an analog input
voltage of 5.090V (5.120 - 11/2 LSB) should be applied to
the VIN(+) pin with the VIN(-) pin grounded. The value of the
VREF/2 input voltage should be adjusted until the digital
output code is just changing from 1111 1110 to 1111 1111.
This value of VREF/2 should then be used for all the tests.
The digital-output LED display can be decoded by dividing
the 8 bits into 2 hex characters, one with the 4 most-
significant bits (MS) and one with the 4 least-significant bits
(LS). The output is then interpreted as a sum of fractions
times the full scale voltage:
.
For example, for an output LED display of 1011 0110, the
MS character is hex B (decimal 11) and the LS character is
hex (and decimal) 6, so:
.
Figures 19 and 20 show more sophisticated test circuits.
Typical Applications
Interfacing 8080/85 or Z-80 Microprocessors
VOUT
MS
16
---------
LS
256
----------
+
5.12
()V
=
START
VIN (+)
DGND
2.560V
AGND
10
F
150pF
N.O.
0.1
F
0.1
F
TANTALUM
5.120V
5V
1.3k
LEDs
(8)
MSB
LSB
10k
VREF/2
+
11
12
13
14
15
16
17
18
20
19
10
9
8
7
6
5
4
3
2
1
ADC0803-
ADC0804
FIGURE 18. BASIC TESTER FOR THE A/D
VOUT
11
16
------
6
256
----------
+
5.12
()
3.64V
==
ANALOG
INPUTS
“A”
R
“B”
R
“C”
100R
-
+
A2
8-BIT
A/D UNDER
TEST
10-BIT
DAC
VANALOG OUTPUT
100X ANALOG
-
+
A1
ERROR VOLTAGE
FIGURE 19. A/D TESTER WITH ANALOG ERROR OUTPUT. THIS
CIRCUIT CAN BE USED TO GENERATE “ERROR
PLOTS” OF FIGURE 11.
A/D UNDER
TEST
10-BIT
DAC
DIGITAL
VANALOG
INPUTS
DIGITAL
OUTPUTS
FIGURE 20. BASIC “DIGITAL” A/D TESTER
ADC0803, ADC0804
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ADC0804LCN | 制造商:Texas Instruments 功能描述:IC 8BIT ADC DIP20 804 |
| ADC0804LCN/A+ | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Analog-to-Digital Converter， 8-Bit |
| ADC0804LCN/B+ | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:Analog-to-Digital Converter， 8-Bit |
| ADC0804LCN/NOPB | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC 8B UP COMPATIBLE ADC RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
| ADC0804LCN/NOPB | 制造商:Texas Instruments 功能描述:A/D Converter (A-D) IC |
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