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參數(shù)資料
| 型號： | AD10465BZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 22/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC DUAL 14BIT 68-CLCC |
| 標準包裝： | 1 |
| 位數(shù)： | 14 |
| 采樣率（每秒）： | 65M |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 轉換器數(shù)目： | 2 |
| 功率耗散（最大）： | 3.9W |
| 電壓電源： | 模擬和數(shù)字，雙 ± |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 68-CLCC |
| 供應商設備封裝： | 68-CLCC（24.13x24.13） |
| 包裝： | 托盤 |
| 輸入數(shù)目和類型： | 6 個單端，雙極 |
AD10465
Rev. A | Page 7 of 24
ABSOLUTE MAXIMUM RATINGS
Table 2.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Parameter
Min
Max
Units
ELECTRICAL
VCC Voltage
0
+7
V
VEE Voltage
–7
0
V
Analog Input Voltage
VEE
VCC
V
Analog Input Current
10
+10
mA
Digital Input Voltage (ENCODE)
0
VCC
V
Table 3. Test Levels
ENCODE, ENCODE
4
V
Differential Voltage
Level
Description
Digital Output Current
10
+10
mA
I
100% production tested.
ENVIRONMENTAL1
II
100% production tested at 25°C, and sample tested at
specified temperatures. AC testing done on sample
basis.
Operating Temperature Range (Case)
40
+85
°C
Maximum Junction Temperature
174
°C
Lead Temperature (Soldering, 10 sec)
300
°C
III
Sample tested only.
Storage Temperature Range (Ambient)
65
+150
°C
IV
Parameter is guaranteed by design and characterization
testing.
1Typical thermal impedance for 68-lead CLCC package: θJC = 2.2°C/W; θJA =
24.3°C/W.
V
Parameter is a typical value only.
VI
100% production tested at 25°C, sample tested at
temperature extremes.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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