參數(shù)資料
型號： 440GRX
廠商： Applied Micro Circuits Corp.
英文描述： PowerPC 440GRx Embedded Processor
中文描述： 嵌入式處理器的PowerPC 440GRx
文件頁數(shù)： 62/88頁
文件大?。?/td> 603K
代理商： 440GRX
440GRx – PPC440GRx Embedded Processor
Revision 1.08 – October 15, 2007
AMCC Proprietary
65
Preliminary Data Sheet
Input Logic Low 3.3V PCI
VIL
0.5
0.35OVDD
V1
Input Logic Low 3.3V LVTTL
0
+0.8
V
Input Logic Low 2.5V CMOS
0
+0.7
V
Input Logic Low 1.8V DDR2 (2.5V DDR1)
0.3 (0.3)
SVREF
0.125 (0.15)
V
Output Logic High 3.3V PCI
VOH
0.9OVDD
-V
1
Output Logic High 3.3V LVTTL
+2.4
+3.6
V
Output Logic High 2.5V CMOS
+2.0
+2.7
V
Output Logic High 1.8V DDR2 (2.5V DDR1)
+0.95 (+1.7)
+1.95 (+2.7)
V
5
Output Logic Low 3.3V PCI
VOL
-
0.1OVDD
V1
Output Logic Low 3.3V LVTTL
0
+0.4
V
Output Logic Low 2.5V CMOS
0
+0.4
V
Output Logic Low 1.8V DDR2 (2.5V DDR1)
0
+0.43 (+0.54)
V
5
Input Leakage Current (no pull-up or pull-down)
IIL1
00
μA
Input Leakage Current for pull-down
IIL2
0 (LPDL)
200 (MPUL)
μA
Input Leakage Current for pull-up
IIL3
150 (LPDL)
0 (MPUL)
μA
Input Max Allowable Overshoot 3.3V LVTTL
VIMAO
+3.9
V
Input Max Allowable Undershoot 3.3V LVTTL
VIMAU
0.6
V
Output Max Allowable Overshoot 3.3V LVTTL
VOMAO
+3.9
V
Output Max Allowable Undershoot 3.3V LVTTL
VOMAU3
0.6
V
Case Temperature
TC
40
+100
°C6
Notes:
1. PCI drivers meet PCI specifications.
2. SVREF = SOVDD/2. SOVDD = +1.8V for DDR2 memory or +2.5V for DDR1 memory.
3. The analog voltages used for the on-chip PLLs can be derived from the logic voltage, but must be filtered before entering the
PPC440GRx. See “Absolute Maximum Ratings” on page 64.
4. Startup sequencing of the power supply voltages is not required. A power-down cycle must complete (OVDD and VDD are below +0.4V)
before a new power-up cycle is started
5. At IOH = IOL= 10ma.
6. Case temperature, TC, is measured at top center of case surface with device soldered to a circuit board.
Table 11. Recommended DC Operating Conditions (Sheet 2 of 2)
Device operation beyond the conditions specified is not recommended. Extended operation beyond the recommended
conditions can affect device reliability.
Parameter
Symbol
Minimum
Typical
Maximum
Unit
Notes
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