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參數(shù)資料
| 型號： | TC58NS256DC |
| 廠商： | Toshiba Corporation |
| 英文描述： | TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS 256-MBIT (32M ?8 BITS) CMOS NAND E2PROM (32M BYTE SmartMediaTM) |
| 中文描述： | 馬鞍山暫定東芝數(shù)字集成電路硅柵CMOS 256兆位（32M的？8位）的CMOS NAND型E2PROM的（32兆字節(jié)SmartMediaTM） |
| 文件頁數(shù)： | 20/33頁 |
| 文件大小： | 709K |
| 代理商： | TC58NS256DC |
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TC58NS256DC
2000-08-27 20/33
Status Read
The device automatically implements the execution and verification of the Program and Erase operations.
The Status Read function is used to monitor the Ready/Busy status of the device, determine the result
(pass/fail) of a Program or Erase operation, and determine whether the device is in Protect mode. The device
status is output via the I/O port on the RE clock after a 70H command input. The resulting information is
outlined in Table 5.
Table 5. Status output table
STATUS
OUTPUT
I/O1
Pass/Fail
Pass: 0
Fail: 1
I/O2
Not Used
0
I/O3
Not Used
0
I/O4
Not Used
0
I/O5
Not Used
0
I/O6
Not Used
0
I/O7
Ready/Busy
Ready: 1
Busy: 0
I/O8
Write Protect
Protect: 0
Not Protected: 1
The Pass/Fail status on I/O1 is only
valid when the device is in the Ready
state.
An application example with multiple devices is shown in Figure 6.
System Design Note: If the
diagram, the Status Read function can be used to determine the status of each individual device.
BY
/
RY
pin signals from multiple devices are wired together as shown in the
Device
1
CLE
ALE
WE
RE
1
CE
Device
2
2
CE
Device
3
3
CE
Device
N
N
CE
Device
N
+
1
1
N
CE
+
I/O1
~I/O8
BY
/
RY
WE
RE
Status on
Device 1
70H
1
CE
ALE
I/O
70H
Status on
Device N
CLE
N
CE
Figure 6. Status Read timing application example
Busy
BY
/
RY
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