參數(shù)資料
型號: SSTV16857MTDX
元件分類: 通用總線功能
英文描述: Memory Driver
中文描述: 記憶體驅(qū)動(dòng)
文件頁數(shù): 5/6頁
文件大?。?/td> 76K
代理商: SSTV16857MTDX
5
www.fairchildsemi.com
S
AC Loading and Waveforms
(See Notes A through F below)
Note:
C
L
includes probe and jog capacitance
FIGURE 1. AC Test Circuit
FIGURE 2. Voltage Waveforms - Pulse Duration
Note:
I
DD
tested with clock and data inputs held at V
DD
or GND,
and I
O
=
0 mA.
FIGURE 3. Voltage and Current Waveforms Inputs
Active and Inactive Times
FIGURE 4. Voltage Waveforms -
Propagation Delay Times
FIGURE 5. Voltage Waveforms - Setup and Hold Times
FIGURE 6. Voltage Waveforms -
RESET Propagation Delay Times
FIGURE 7. Voltage Waveforms -
RESET Removal Delay Times
Note A:
All input pulses are supplied by generators having
the following characteristics:
PRR
10 MHz, Z
0
=
50
, input slew rate
=
1V/ns
±
20%
(unless otherwise specified).
Note B
: The outputs are measured one at a time with one
transition per measurement.
Note C:
V
TT
=
V
REF
=
V
DD
/2.
Note D:
V
IH
=
V
REF
+
310 mV (AC voltage levels) for differ-
ential inputs. V
IH
=
V
DD
for LVCMOS input.
Note E:
V
IL
=
V
REF
310 mV (AC voltage levels) for differ-
ential inputs. V
IL
=
GND for LVCMOS input.
Note F:
Removal time (t
REM
) is tested with one data input
held active HIGH. The propagation time from CK to the cor-
responding output must meet valid timing specifications for
the measurement to be accurate.
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