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參數(shù)資料
| 型號： | SNJ54BCT8374AJT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CDIP24 |
| 封裝： | 0.300 INCH, CERAMIC, DIP-24 |
| 文件頁數(shù)： | 10/26頁 |
| 文件大小： | 434K |
| 代理商： | SNJ54BCT8374AJT |
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SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E JUNE 1990 REVISED JULY 1996
18
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
POST OFFICE BOX 1443
HOUSTON, TEXAS 772511443
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 9)
VCC = 5 V,
TA = 25°C
SN54BCT8374A
SN74BCT8374A
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
CLK
0
70
0
70
0
70
MHz
tw
Pulse duration
CLK high or low
5
ns
tsu
Setup time
Data before CLK
↑
3
ns
th
Hold time
Data after CLK
↑
2
ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 9)
VCC = 5 V,
TA = 25°C
SN54BCT8374A
SN74BCT8374A
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
TCK
0
20
0
20
0
20
MHz
t
Pulse duration
TCK high or low
25
ns
tw
Pulse duration
TMS double high
50*
50
ns
Any D before TCK
↑
6
t
Setup time
CLK or OE before TCK
↑
6
ns
tsu
Setup time
TDI before TCK
↑
6
ns
TMS before TCK
↑
12
Any D after TCK
↑
4.5
t
Hold time
CLK or OE after TCK
↑
4.5
ns
th
Hold time
TDI after TCK
↑
4.5
ns
TMS after TCK
↑
0
td
Delay time
Power up to TCK
↑
100*
100
ns
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
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