參數(shù)資料
型號(hào)： SN74ABT18245ADGG
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PDSO56
封裝： PLASTIC, TSSOP-56
文件頁(yè)數(shù)： 3/31頁(yè)
文件大?。?/td> 438K
代理商： SN74ABT18245ADGG
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES
WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
instruction-register opcode description
The instruction-register opcodes are shown in Table 3. The following descriptions detail the operation of each
instruction.
Table 3. Instruction-Register Opcodes
BINARY CODE
BIT 7
→ BIT 0
MSB
→ LSB
SCOPE OPCODE
DESCRIPTION
SELECTED DATA
REGISTER
MODE
00000000
EXTEST
Boundary scan
Test
10000001
IDCODE
Identification read
Device identification
Normal
10000010
SAMPLE/PRELOAD
Sample boundary
Boundary scan
Normal
00000011
BYPASS
Bypass scan
Bypass
Normal
10000100
BYPASS
Bypass scan
Bypass
Normal
00000101
BYPASS
Bypass scan
Bypass
Normal
00000110
HIGHZ
Control boundary to high impedance
Bypass
Modified test
10000111
CLAMP
Control boundary to 1/0
Bypass
Test
10001000
BYPASS
Bypass scan
Bypass
Normal
00001001
RUNT
Boundary-run test
Bypass
Test
00001010
READBN
Boundary read
Boundary scan
Normal
10001011
READBT
Boundary read
Boundary scan
Test
00001100
CELLTST
Boundary self test
Boundary scan
Normal
10001101
TOPHIP
Boundary toggle outputs
Bypass
Test
10001110
SCANCN
Boundary-control register scan
Boundary control
Normal
00001111
SCANCT
Boundary-control register scan
Boundary control
Test
All others
BYPASS
Bypass scan
Bypass
Normal
Bit 7 is used to maintain even parity in the 8-bit instruction.
The BYPASS instruction is executed in lieu of a SCOPE
instruction that is not supported in the ’ABT18245A.
boundary scan
This instruction conforms to the IEEE Standard 1149.1-1990 EXTEST instruction. The BSR is selected in the
scan path. Data appearing at the device input and I/O pins is captured in the associated BSCs. Data that has
been scanned into the input BSCs is applied to the inputs of the normal on-chip logic, while data scanned into
the I/O BSCs for pins in the output mode is applied to the device I/O pins. Data present at the device I/O pins
is passed through the I/O BSCs to the normal on-chip logic. For I/O pins, the operation of a pin as input or output
is determined by the contents of the output-enable BSCs (bits 43–40 of the BSR). When a given output enable
is active (logic 1), the associated I/O pins operate in the output mode. Otherwise, the I/O pins operate in the
input mode. The device operates in the test mode.
identification read
This instruction conforms to the IEEE Standard 1149.1-1990 IDCODE instruction. The IDR is selected in the
scan path. The device operates in the normal mode.
sample boundary
This instruction conforms to the IEEE Standard 1149.1-1990 SAMPLE/PRELOAD instruction. The BSR is
selected in the scan path. Data appearing at the device input pins and I/O pins in the input mode is captured
in the associated BSCs, while data appearing at the outputs of the normal on-chip logic is captured in the BSCs
associated with I/O pins in the output mode. The device operates in the normal mode.
相關(guān)PDF資料
PDF描述
SN74ABT18502PMR ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74ABT18502PM ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74ABT18504PMRG4 ABT SERIES, 20-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74ABT18640DGGR ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56
SN74ABT18640DLR ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABT18245ADGGR 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18245ADL 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18245ADLG4 功能描述:特定功能邏輯 Scan Test Device w/18-Bit Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18245ADLR 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT18245ADLRG4 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*