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參數(shù)資料
| 型號： | SN74ABT18245ADGG |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PDSO56 |
| 封裝： | PLASTIC, TSSOP-56 |
| 文件頁數(shù)： | 22/31頁 |
| 文件大?。?/td> | 438K |
| 代理商： | SN74ABT18245ADGG |
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Product Folder: SN54ABT18245A, Scan Test Devices With 18-Bit Bus Transceivers
Keyword
Part Number
PRODUCT SUPPORT: DEVELOPMENT TOOLS | TRAINING
SN54ABT18245A, Scan Test Devices With 18-Bit Bus Transceivers
DEVICE STATUS: ACTIVE
PARAMETER NAME SN54ABT18245A SN74ABT18245A
Voltage Nodes (V) 5
5
Vcc range (V)
4.5 to 5.5
Input Level
TTL
Logic
True
No. of Outputs
18
Output Drive (mA) -24/48
-32/64
tpd max (ns)
5.8
5.4
Output Level
TTL
Static Current
38
21.5
FEATURES
q
Members of the Texas Instruments SCOPETM Family of Testability Products
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Members of the Texas Instruments WidebusTM Family
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Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
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SCOPETM Instruction Set
r
IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ
r
Parallel-Signature Analysis at Inputs
r
Pseudo-Random Pattern Generation From Outputs
r
Sample Inputs/Toggle Outputs
r
Binary Count From Outputs
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Device Identification
r
Even-Parity Opcodes
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State-of-the-Art EPIC-II BTM BiCMOS Design Significantly Reduces Power Dissipation
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Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages
SCOPE, Widebus, and EPIC-IIB are trademarks of Texas Instruments Incorporated.
DESCRIPTION
The 'ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPETM testability integrated-
circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-
wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit noninverting bus transceivers. They can be used either as two 9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take
snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPETM
bus transceivers.
Data flow is controlled by the direction-control (DIR) and output-enable (OE\) inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at
DIR. OE\ can be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the input/output (I/O) boundary of the device. When enabled, the
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74ABT18245ADGGR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADL | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLG4 | 功能描述:特定功能邏輯 Scan Test Device w/18-Bit Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLRG4 | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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