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參數(shù)資料
| 型號(hào)： | SN74ABT18245ADGG |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, TRUE OUTPUT, PDSO56 |
| 封裝： | PLASTIC, TSSOP-56 |
| 文件頁數(shù)： | 24/31頁 |
| 文件大?。?/td> | 438K |
| 代理商： | SN74ABT18245ADGG |
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Product Folder: SN54ABT18245A, Scan Test Devices With 18-Bit Bus Transceivers
test circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test-data input (TDI), test-data output (TDO), test-mode select (TMS), and test clock (TCK). Additionally, the test circuitry
performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to
the TAP interface.
The SN54ABT18245A is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT18245A is characterized for operation from -40°C to 85°C.
TECHNICAL DOCUMENTS
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DATASHEET
APPLICATION NOTES
View Application Notes for Boundary Scan (JTAG) Bus Devices
View Application Notes for Digital Logic
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Advanced BiCMOS Technology (ABT) Logic Characterization Information (Rev. B) (SCBA008B - Updated: 06/01/1997)
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Advanced BiCMOS Technology (ABT) Logic Enables Optimal System Design (Rev. A) (SCBA001A - Updated: 03/01/1997)
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Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) (SCBA012A - Updated: 08/01/1997)
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Evaluation of Nickel/Palladium/Gold-Finished Surface-Mount Integrated Circuits (SZZA026 - Updated: 06/20/2001)
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Family of Curves Demonstrating Output Skews for Advanced BiCMOS Devices (Rev. A) (SCBA006A - Updated: 12/01/1996)
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Understanding and Interpreting Texas Instruments Standard-Logic Products Data Sh (Rev. A) (SZZA036A - Updated: 02/27/2003)
MORE LITERATURE
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Overview of IEEE Std 91-1984, Explanation of Logic Symbols Training Booklet (Rev. A) (SDYZ001A, 138 KB - Updated: 07/01/1996)
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USER GUIDES
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BLOCK DIAGRAMS
PRICING/AVAILABILITY/PKG
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
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| SN74ABT18245ADGGR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADL | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLG4 | 功能描述:特定功能邏輯 Scan Test Device w/18-Bit Bus Trnscvr RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLR | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT18245ADLRG4 | 功能描述:特定功能邏輯 Scan Test Device RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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