參數(shù)資料
型號(hào)： SN54LVTH18502AHV
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68
封裝： CERAMIC, QFP-68
文件頁(yè)數(shù)： 6/38頁(yè)
文件大?。?/td> 556K
代理商： SN54LVTH18502AHV
SN54LVTH18502A, SN54LVTH182502A, SN74LVTH18502A, SN74LVTH182502A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS668B – JULY 1996 – REVISED MARCH 1999
14
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
bypass scan
This instruction conforms to the IEEE Standard 1149.1-1990 BYPASS instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in the normal mode.
control boundary to high impedance
This instruction conforms to the IEEE Standard 1149.1a-1993 HIGHZ instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device
operates in a modified test mode in which all device I/O pins are placed in the high-impedance state, the device
input pins remain operational, and the normal on-chip logic function is performed.
control boundary to 1/0
This instruction conforms to the IEEE Standard 1149.1a-1993 CLAMP instruction. The bypass register is
selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the I/O
BSCs for pins in the output mode is applied to the device I/O pins. The device operates in the test mode.
boundary-run test
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during
Run-Test /Idle. The five test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP),
PRPG, PSA, simultaneous PSA and PRPG (PSA/PRPG), and simultaneous PSA and binary count up
(PSA/COUNT).
boundary read
The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This
instruction is useful for inspecting data after a PSA operation.
boundary self test
The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR.
In this way, the contents of the shadow latches can be read out to verify the integrity of both shift-register and
shadow-latch elements of the BSR. The device operates in the normal mode.
boundary toggle outputs
The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during
Capture-DR. Data in the shift-register elements of the selected output-mode BSCs is toggled on each rising
edge of TCK in Run-Test /Idle and is then updated in the shadow latches and applied to the associated device
I/O pins on each falling edge of TCK in Run-Test /Idle. Data in the input-mode BSCs remains constant. Data
appearing at the device input or I/O pins is not captured in the input-mode BSCs. The device operates in the
test mode.
boundary-control-register scan
The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This
operation must be performed before a boundary-run test operation to specify which test operation is to
be executed.
相關(guān)PDF資料
PDF描述
SN54LVTH182512HKC LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64
SN54LVTH182516HKC LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64
SNJ54LVTH18516HKC LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64
SNJ54LVTH182516HKC LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64
SN54LVTH182646AHV LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54S00J 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk
SN54S00W 制造商:Rochester Electronics LLC 功能描述:- Bulk
SN54S02J 制造商:Texas Instruments 功能描述:
SN54S03J 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube
SN54S04J 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC*
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*