參數(shù)資料
型號: SN54LVTH18502AHV
廠商: TEXAS INSTRUMENTS INC
元件分類: 總線收發(fā)器
英文描述: LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68
封裝: CERAMIC, QFP-68
文件頁數(shù): 31/38頁
文件大?。?/td> 556K
代理商: SN54LVTH18502AHV
Product Folder: SN54LVTH18502A, 3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
Data flow in each direction is controlled by output-enable (OEAB\ and OEBA\), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent
mode when LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of
CLKAB. When OEAB\ is low, the B outputs are active. When OEAB\ is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the OEBA\, LEBA, and CLKBA
inputs.
In the test mode, the normal operation of the SCOPETM universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test
circuitry performs boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test
circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are
synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of 'LVTH182502A, which are designed to source or sink up to 12 mA, include 25-
series resistors to reduce overshoot and undershoot.
The SN54LVTH18502A and SN54LVTH182502A are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74LVTH18502A and SN74LVTH182502A are characterized for
operation from -40°C to 85°C.
A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA\, LEBA, and CLKBA.
Output level before the indicated steady-state input conditions are established
TECHNICAL DOCUMENTS
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DATASHEET
Full datasheet in Acrobat PDF: sn54lvth18502a.pdf (478 KB,Rev.B) (Updated: 03/08/1999)
APPLICATION NOTES
View Application Notes for Digital Logic
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LVT Family Characteristics (Rev. A) (SCEA002A - Updated: 03/01/1998)
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LVT-to-LVTH Conversion (SCEA010 - Updated: 12/08/1998)
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Live Insertion (SDYA012 - Updated: 10/01/1996)
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Low Voltage Logic Families (Rev. A) (SCVAE01A - Updated: 06/01/1998)
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MORE LITERATURE
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Enhanced Plastic Portfolio Brochure (SGZB004, 387 KB - Updated: 08/19/2002)
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Logic Reference Guide (SCYB004, 1032 KB - Updated: 10/23/2001)
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MicroStar Junior BGA Design Summary (SCET004, 167 KB - Updated: 07/28/2000)
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Military Brief (SGYN138, 803 KB - Updated: 10/10/2000)
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Military Low Voltage Solutions (SGYN139, 103 KB - Updated: 04/04/2001)
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Palladium Lead Finish User's Manual (SDYV001, 2041 KB - Updated: 11/01/1996)
file:///E|/042120003_HTML/sn54lvth18502a.html (2 of 3) [24-Apr-03 3:02:20 PM]
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