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| 型號： | SMFR-29C516ESC |
| 廠商： | TEMIC SEMICONDUCTORS |
| 元件分類： | 算術(shù)邏輯單元 |
| 英文描述： | 16-BIT ERROR DETECT AND CORRECT CKT, QFP100 |
| 封裝： | MQFP-100 |
| 文件頁數(shù)： | 32/42頁 |
| 文件大?。?/td> | 809K |
| 代理商： | SMFR-29C516ESC |
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4.8
ENVIRONMENTAL AND ENDURANCE TESTS
4.8.1
Electrical Measurements at Completion of Environmental Tests
The parameters to be measured on completion of environmental tests are scheduled in Table
6. Unless otherwise stated, the measurements shall be performed at T
amb = 22 +3°C
4.8.2
Electrical Measurements at Intermediate Point during Endurance Tests
The parameters to be measured at intermediate points during endurance
tests are scheduled in
Table 6 of this specification . Unless otherwise stated, the measurements shall be performed at
T
amb = 22+3°C
4.8.3
Electrical Measurements on Completion ofEndurance Tests
The parameters to be measured on Completion of
endurance testing are scheduled in Table 6
of this specification . Unless otherwise stated, the measurements shall be performed at
T
amb = 22+3°C
4.8.4
Conditions for Operating Life-
Tests
The requirements for operating life testing are specified in para
. 9.21 of ESA/SCC Generic
Specification N° 9000 . The conditions for operating life testing shall be as specified in Table 5
of this specification .
4.8.5
Electrical Circuitsfor Operating Life-Tests
Circuits for use in performing life-tests are shown in Figure 5 of this specification .
4.8.6
Condition For High Temperature Storage Test
The requirements for high temperature storage test are specified in
ESA/SCC Generic
Specification N° 9000 . The temperature to be applied shall be the maximum storage
temperature specified in Table 1(b) of this specification .
4.9
TOTAL DOSE IRRADIATION TESTING
4.9.1
Application
If specified in Par.. 4.2.1 of this specification, total dose irradiation testing shall be performed in
accordance with the requirements of ESA/SCC Basic Specification N° 22900.
4.9.2
Bias Conditions
Continuous bias shall be applied during irradiation testing as shown in Figure 6 of this
specification .
4.9.3
Electrical Measurements
The parameters to be measured prior to irradiation exposure are scheduled in Table 2 of this
specification . Only devices which meet the requirements of Table 2 shall be included in the
test sample .
The parameters to be measured during and on completion of irradiation testing are scheduled
in Table 7 of this specification .
Document number
MHS/SCC 021
Date
Issue
Page
23/12/1999
Rev C
38
Rev C
38 /42
TEMI C
Semiconductors
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