參數(shù)資料
型號(hào)： SMFR-29C516ESC
廠商： TEMIC SEMICONDUCTORS
元件分類(lèi)： 算術(shù)邏輯單元
英文描述： 16-BIT ERROR DETECT AND CORRECT CKT, QFP100
封裝： MQFP-100
文件頁(yè)數(shù)： 10/42頁(yè)
文件大?。?/td> 809K
代理商： SMFR-29C516ESC
2
APPLICABLE DOCUMENTS
The following documents forms are part of thisspecification and shall be read in conjunction
with it :
(a)
ESA / SCC Generic Specification N° 9000 for Integrated Circuits.
(b)
MIL-STD-883 Test Methods and Procedures for Micro-electronics.
(c) ESA/SCC Basic Specification N°22900. Total dose Steady-state irradiation
test method.
(d) Test Program (Sentry 15),T65TA2 for HiRel (level B and C) and T65TA1 for
engineering models (EM, -2)
The issues and revisions of applicable documents that apply are those that are validat the date
of the purchase order. In case of confict between purchase order and specification, the
requirements in the purchase order shall have precedence.
3
TERMS, DEFINITIONS, ABBREVIATIONS , SYMBOLS AND UNITS
For the purpose of this specification, the terms, definitions, abbreviations, symbols and units
mentioned in ESA / SCC Basic Specification N° 21300 and N° 21390 shall be applied. In
addition, the following abbreviations are used :
Signal
name
Pin
Type
Active state
Description
U1D(15:0)
28, 33-35, 37-40, 42-45,
47-49, 53
I/O, BUF
High
User 1 Data bus
U2D(15:0)
5-8, 10-13, 15-18, 20-23
I/O, BUF
High
User 2 Data bus
MD(15:0)
59-62, 64-67, 69-72,
74-77
I/O, BUF
High
Memory Data bus
MC(7:0)
83, 86, 88-91
I/O, BUF
High
Memory Check-bit bus
R/W1N
55
I
High/Low
User 1 Read/Write
signal
EN1N
56
I
Low
User 1 Output Enable
M1N
57
I
Low
User 1 Memory Select
R/W2N
99
I
High/Low
User 2 Read/Write
signal
EN2N
94
I
Low
User 2 Output Enable
M2N
3
I
Low
User 2 Memory Select
Document number
MHS/SCC 021
Date
Issue
Page
23/12/1999
Rev C
18
Rev C
18 /42
TEMI C
Semiconductors
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