參數(shù)資料
型號: S71PL129JC0BFW9Z2
廠商: SPANSION LLC
元件分類: 存儲器
英文描述: Stacked Multi-Chip Product (MCP) Flash Memory
中文描述: SPECIALTY MEMORY CIRCUIT, PBGA64
封裝: 8 X 11.60 MM, 1.20 MM HEIGHT, LEAD FREE, FBGA-64
文件頁數(shù): 134/153頁
文件大?。?/td> 3651K
代理商: S71PL129JC0BFW9Z2
October 28, 2005 S71PL129Jxx_00_A8
S71PL129JC0/S71PL129JB0/S71PL129JA0
79
Advance
Informatio n
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 100,000 cycles. Additionally,
programming typicals assume checkerboard pattern. All values are subject to change.
2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles. All values are subject to change.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most
bytes program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program
command. See Table 12 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 100,000 cycles.
BGA Pin Capacitance
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
Figure 23. Timing Diagram for Alternating Between CE1# and CE2# Control
Table 25. Erase And Programming Performance
Parameter
Unit
Comments
Sector Erase Time
0.5
2
sec
Excludes 00h programming
prior to erasure (Note 4)
Chip Erase Time
PL129J
135
216
sec
Word Program Time
6
100
s
Excludes system level
overhead (Note 5)
Accelerated Word Program Time
4
60
s
Chip Program Time
PL129J
50.4
200
sec
Parameter Symbol
Parameter Description
Test Setup
Typ
Max
Unit
CIN
Input Capacitance
VIN = 0
6.3
7
pF
COUT
Output Capacitance
VOUT = 0
7.0
8
pF
CIN2
Control Pin Capacitance
VIN = 0
5.5
8
pF
CIN3
WP#/ACC Pin Capacitance
VIN = 0
11
12
pF
CE1#
tCCR
CE2#
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