參數(shù)資料
型號: MPC8540PXALDB
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, 667 MHz, MICROPROCESSOR, PBGA783
封裝: 29 X 29 MM, 3.75 MM HEIGHT, 1 MM PITCH, FLIP CHIP, PLASTIC, BGA-783
文件頁數(shù): 86/104頁
文件大小: 2133K
代理商: MPC8540PXALDB
MPC8540 Integrated Processor Hardware Specifications, Rev. 3.1
82
Freescale Semiconductor
Thermal
16 Thermal
This section describes the thermal specifications of the MPC8540.
16.1 Thermal Characteristics
Table 58 provides the package thermal characteristics for the MPC8540.
16.2 Thermal Management Information
This section provides thermal management information for the flip chip plastic ball grid array (FC-PBGA) package
for air-cooled applications. Proper thermal control design is primarily dependent on the system-level design—the
heat sink, airflow, and thermal interface material. The recommended attachment method to the heat sink is illustrated
in Figure 45. The heat sink should be attached to the printed-circuit board with the spring force centered over the
die. This spring force should not exceed 10 pounds force.
Table 58. Package Thermal Characteristics
Characteristic
Symbol
Value
Unit
Notes
Junction-to-ambient Natural Convection on four layer board (2s2p)
RθJMA
16
°C/W
1, 2
Junction-to-ambient (@100 ft/min or 0.5 m/s) on four layer board (2s2p)
RθJMA
14
°C/W
1, 2
Junction-to-ambient (@200 ft/min or 1 m/s) on four layer board (2s2p)
RθJMA
12
°C/W
1, 2
Junction-to-board thermal
RθJB
7.5
°C/W
3
Junction-to-case thermal
RθJC
0.8
°C/W
4
Notes
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance
2. Per JEDEC JESD51-6 with the board horizontal.
3. Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is
measured on the top surface of the board near the package.
4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1). Cold plate temperature is used for case temperature; measured value includes the thermal
resistance of the interface layer.
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